公开(公告)号：US20170284791A1

公开(公告)日：2017-10-05

申请号：US15627948

申请日：2017-06-20

Applicant: BOE TECHNOLOGY GROUP CO., LTD. ,  HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Yangkun JING ,  Changjun JIANG

IPC: G01B11/06 ,  G01B9/02

CPC classification number: G01B11/0675 ,  G01B9/02016 ,  G01B9/0203 ,  G01B11/0616 ,  G01J2009/0238

Abstract: The present invention provides a detection device and a detection method. The detection device comprises a light source module, a receiving module, an image generation module and a judgment module. The light source module is configured to emit light towards a film at a predetermined angle, the receiving module is configured to receive interference light formed by first reflected light reflected by an upper surface of the film and second reflected light reflected by a lower surface of the film, the image generation module is configured to generate an equal thickness interference fringe image according to the interference light, and the judgment module is configured to judge whether thickness of the film is uniform according to the equal thickness interference fringe image. The detection device can perform high accuracy detection on uniformity of the thickness of a film, thereby facilitating improving display quality of a display panel.

公开(公告)号：US20160135679A1

公开(公告)日：2016-05-19

申请号：US14899559

申请日：2014-06-20

Applicant: Cylite Pty Ltd

Inventor： Steven James Frisken ,  Grant Andrew Frisken

IPC: A61B3/10 ,  A61B3/117 ,  A61B3/107 ,  G01B9/02 ,  A61B3/00

CPC classification number: A61B3/1015 ,  A61B3/0025 ,  A61B3/1025 ,  A61B3/107 ,  A61B3/117 ,  A61B3/14 ,  G01B9/02027 ,  G01B9/02039 ,  G01B9/02041 ,  G01B9/02044 ,  G01B9/02091 ,  G01B2290/70 ,  G01J9/02 ,  G01J2009/0219 ,  G01J2009/0238 ,  G02B27/1013 ,  G02B27/283 ,  G02C7/027 ,  G02C2202/24

Abstract: Method and systems are presented for analysing a wavefront using a spectral wavefront analyser to extract optical phase and spectral information at a two dimensional array of sampling points across the wavefront, wherein the relative phase information between the sampling points is maintained. Methods and systems are also presented for measuring an eye by reflecting a wavefront of an eye and measuring the wavefront at a plurality of angles to provide a map of the off-axis relative wavefront curvature and aberration of the eye. The phase accuracy between wavelengths and sample points over a beam aperture offered by these methods and systems have a number of ocular applications including corneal and anterior eye tomography, high resolution retinal imaging, and wavefront analysis as a function of probe beam incident angle for determining myopia progression and for designing and testing lenses for correcting myopia.

Abstract translation: 提出了一种方法和系统，用于使用光谱波前分析器分析波前，以在波阵面上的采样点的二维阵列提取光学相位和光谱信息，其中保持采样点之间的相对相位信息。 还提出了用于通过反射眼睛的波前并以多个角度测量波前来测量眼睛的方法和系统，以提供离轴相对波前曲率和眼睛的像差的图。 这些方法和系统提供的光束孔径之间的波长和采样点之间的相位精度具有许多眼睛应用，包括角膜和前眼层析成像，高分辨率视网膜成像和波前分析作为用于确定近视的探针束入射角的函数 进展和设计和测试矫正近视眼镜。

公开(公告)号：US20100091146A1

公开(公告)日：2010-04-15

申请号：US12161362

申请日：2007-01-18

Applicant: José Manuel Rodriguez Ramos ,  Fernando Rosa González ,  José Gil Marichal-Hernández

Inventor： José Manuel Rodriguez Ramos ,  Fernando Rosa González ,  José Gil Marichal-Hernández

IPC: H04N5/225 ,  G06K9/36

CPC classification number: G01J9/00 ,  G01J2009/0238 ,  G01S11/12 ,  G02B26/06

Abstract: A system consisting of a phase camera with microlenses placed in the focal point of a converging lens, wherein the camera data, processed using a combined Fourier “Slice” and fast Fourier transform edge detection technique, provide both a three-dimensional wavefront map and a real scene depth map within a broad range of volumes. The invention is suitable for use in any field where wavefronts need to be known such as earth-based astronomical observation, ophthalmology, etc., as well as in fields requiring metrology, e.g. real scenes, CCD polishing, automobile mechanics, etc. The invention is applied to the particular case of atmospheric tomography using ELTs (large-diameter telescopes: 50 or 100 meters).

Abstract translation: 一种由放置在会聚透镜的焦点中的具有微透镜的相位相机组成的系统，其中使用组合傅立叶“切片”和快速傅立叶变换边缘检测技术处理的相机数据同时提供三维波前图和 真实场景深度图范围广泛。 本发明适用于需要知道波前的任何领域，例如基于地球的天文观测，眼科学等，以及需要测量的领域，例如， 实际场景，CCD抛光，汽车力学等。本发明应用于使用ELT（大直径望远镜：50或100米）的大气层析成像的具体情况。

公开(公告)号：US07102755B1

公开(公告)日：2006-09-05

申请号：US10080845

申请日：2002-02-22

Applicant: David M Braun ,  Misty J Mesel

Inventor： David M Braun ,  Misty J Mesel

IPC: G01B9/02 ,  H04J1/16

CPC classification number: G01J1/4257 ,  G01J9/0246 ,  G01J2009/0238

Abstract: A method determines power of a modulated signal that is applied to a wavelength meter by summing bin values within a designated bin range of a frequency transformed interferogram representing the modulated signal and provided by the wavelength meter. In a first embodiment of the method, the bin range within which the bin values are summed is designated by mapping a series of signal characteristics indicative of the types of the modulated signals applied to the wavelength meter, to a series of bin spans within the frequency transformed interferograms that represent the modulated signals. The method then enables a selection of a signal characteristic from the series of signal characteristics to identify the modulated signal that is applied to the wavelength meter. In response to a selection, the bin values are summed within a bin range that is consistent with the mapping of the series of signal characteristics to the series of bin spans and that is positioned about a center bin of the frequency transformed interferogram. In a second embodiment of the method, the bin range within which bin values are summed is designated automatically based on attributes of the frequency transformed interferogram.

Abstract translation: 一种方法通过对表示调制​​信号并由波长计提供的频率变换干涉图的指定仓范围内的二进制数进行求和来确定施加到波长计的调制信号的功率。 在该方法的第一实施例中，通过将表示施加到波长计的调制信号的类型的一系列信号特性映射到频率范围内的一系列箱体间距来指定其中二进制值相加的仓范围 表示调制信号的变换干涉图。 该方法然后使得能够从一系列信号特征中选择信号特征来识别施加到波长计的调制信号。 响应于选择，bin值在与一系列信号特征与一系列仓跨距的映射一致的仓范围内相加，并且位于频率变换干涉图的中心仓周围。 在该方法的第二实施例中，基于频率变换干涉图的属性自动指定bin值相加的仓范围。