公开(公告)号：US11189598B2

公开(公告)日：2021-11-30

申请号：US16570165

申请日：2019-09-13

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： DeokKyung Yang ,  HunTeak Lee ,  SungSoo Kim ,  HeeSoo Lee

IPC: H01L23/02 ,  H01L25/065 ,  H01L23/00 ,  H01L25/00 ,  H01L23/538 ,  H01L25/16 ,  H01L25/10 ,  H01L23/552 ,  H01L23/31 ,  H01L21/56

Abstract: A semiconductor device has a first substrate. A first semiconductor component is disposed on a first surface of the first substrate. A second substrate includes a vertical interconnect structure on a first surface of the second substrate. A second semiconductor component is disposed on the first surface of the second substrate. The first semiconductor component or second semiconductor component is a semiconductor package. The first substrate is disposed over the second substrate with the first semiconductor component and second semiconductor component between the first substrate and second substrate. A first encapsulant is deposited between the first substrate and second substrate. A SiP submodule is disposed over the first substrate or second substrate opposite the encapsulant. A shielding layer is formed over the SiP submodule.

公开(公告)号：US20190172902A1

公开(公告)日：2019-06-06

申请号：US16267142

申请日：2019-02-04

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： JinHee Jung ,  HyungSang Park ,  SungSoo Kim

IPC: H01L49/02 ,  H05K1/18 ,  H01L23/538 ,  H01L21/683 ,  H01L23/00

CPC classification number: H01L28/40 ,  H01L21/486 ,  H01L21/6835 ,  H01L23/49827 ,  H01L23/50 ,  H01L23/5389 ,  H01L24/19 ,  H01L24/25 ,  H01L2221/68345 ,  H01L2224/04105 ,  H01L2224/2518 ,  H01L2224/32225 ,  H01L2224/82031 ,  H01L2224/82039 ,  H01L2224/82047 ,  H01L2224/83005 ,  H01L2224/92144 ,  H05K1/185 ,  H05K3/4664 ,  H05K2201/10015

Abstract: A semiconductor device comprises a first conductive layer. A second conductive layer is formed over the first conductive layer. A semiconductor component is disposed over the first conductive layer. The second conductive layer lies in a plane between a top surface of the semiconductor component and a bottom surface of the semiconductor component. A third conductive layer is formed over the semiconductor component opposite the first conductive layer. The semiconductor device includes a symmetrical structure. A first insulating layer is formed between the first conductive layer and semiconductor component. A second insulating layer is formed between the semiconductor component and third conductive layer. A height of the first insulating layer between the first conductive layer and semiconductor component is between 90% and 110% of a height of the second insulating layer between the semiconductor component and third conductive layer. The semiconductor component includes a passive device.

公开(公告)号：US10236337B2

公开(公告)日：2019-03-19

申请号：US15797107

申请日：2017-10-30

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： JinHee Jung ,  HyungSang Park ,  SungSoo Kim

IPC: H01L23/538 ,  H01L49/02 ,  H01L21/683 ,  H01L23/00 ,  H05K1/18 ,  H01L23/498 ,  H01L23/50 ,  H01L21/48 ,  H05K3/46

Abstract: A semiconductor device comprises a first conductive layer. A second conductive layer is formed over the first conductive layer. A semiconductor component is disposed over the first conductive layer. The second conductive layer lies in a plane between a top surface of the semiconductor component and a bottom surface of the semiconductor component. A third conductive layer is formed over the semiconductor component opposite the first conductive layer. The semiconductor device includes a symmetrical structure. A first insulating layer is formed between the first conductive layer and semiconductor component. A second insulating layer is formed between the semiconductor component and third conductive layer. A height of the first insulating layer between the first conductive layer and semiconductor component is between 90% and 110% of a height of the second insulating layer between the semiconductor component and third conductive layer. The semiconductor component includes a passive device.

公开(公告)号：US20180294236A1

公开(公告)日：2018-10-11

申请号：US16005387

申请日：2018-06-11

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： Byung Joon Han ,  Il Kwon Shim ,  KyoungHee Park ,  Yaojian Lin ,  KyoWang Koo ,  In Sang Yoon ,  SeungYong Chai ,  SungWon Cho ,  SungSoo Kim ,  Hun Teak Lee ,  DeokKyung Yang

IPC: H01L23/552 ,  H01L23/498 ,  H01L21/683 ,  H01L21/48 ,  H01L23/00 ,  H01L25/16 ,  H01L23/31 ,  H01L21/56

Abstract: An integrated circuit packaging system and method of manufacture thereof includes: a substrate with internal circuitry between a substrate top side, a substrate bottom side, and vertical sides; an integrated circuit coupled to the internal circuitry; a molded package body formed directly on the integrated circuit and the substrate top side of the substrate; and a conductive conformal shield structure applied directly on the molded package body, the vertical sides, and to extend below the substrate bottom side coupled to the internal circuitry.

公开(公告)号：US20180294235A1

公开(公告)日：2018-10-11

申请号：US16005348

申请日：2018-06-11

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： Byung Joon Han ,  Il Kwon Shim ,  KyoungHee Park ,  Yaojian Lin ,  KyoWang Koo ,  In Sang Yoon ,  SeungYong Chai ,  SungWon Cho ,  SungSoo Kim ,  Hun Teak Lee ,  DeokKyung Yang

IPC: H01L23/552 ,  H01L23/498 ,  H01L21/683 ,  H01L21/48 ,  H01L23/00 ,  H01L25/16 ,  H01L23/31 ,  H01L21/56

Abstract: An integrated circuit packaging system and method of manufacture thereof includes: a substrate with internal circuitry between a substrate top side, a substrate bottom side, and vertical sides; an integrated circuit coupled to the internal circuitry; a molded package body formed directly on the integrated circuit and the substrate top side of the substrate; and a conductive conformal shield structure applied directly on the molded package body, the vertical sides, and to extend below the substrate bottom side coupled to the internal circuitry.

公开(公告)号：US09997468B2

公开(公告)日：2018-06-12

申请号：US15091049

申请日：2016-04-05

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： Byung Joon Han ,  Il Kwon Shim ,  KyoungHee Park ,  Yaojian Lin ,  KyoWang Koo ,  In Sang Yoon ,  SeungYong Chai ,  SungWon Cho ,  SungSoo Kim ,  Hun Teak Lee ,  DeokKyung Yang

IPC: H01L23/552 ,  H01L21/48 ,  H01L21/683 ,  H01L23/498 ,  H01L23/31 ,  H01L23/00 ,  H01L25/16 ,  H01L21/56

CPC classification number: H01L23/552 ,  H01L21/486 ,  H01L21/561 ,  H01L21/6835 ,  H01L21/6836 ,  H01L23/3114 ,  H01L23/49805 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/49838 ,  H01L23/49894 ,  H01L24/13 ,  H01L24/16 ,  H01L24/97 ,  H01L25/16 ,  H01L2221/68327 ,  H01L2224/13111 ,  H01L2224/16227 ,  H01L2224/97 ,  H01L2924/141 ,  H01L2924/143 ,  H01L2924/1434 ,  H01L2924/15311 ,  H01L2924/19041 ,  H01L2924/19042 ,  H01L2924/19043 ,  H01L2924/19105 ,  H01L2924/3025 ,  H01L2924/01029 ,  H01L2224/81

Abstract: An integrated circuit packaging system and method of manufacture thereof includes: a substrate with internal circuitry between a substrate top side, a substrate bottom side, and vertical sides; an integrated circuit coupled to the internal circuitry; a molded package body formed directly on the integrated circuit and the substrate top side of the substrate; and a conductive conformal shield structure applied directly on the molded package body, the vertical sides, and to extend below the substrate bottom side coupled to the internal circuitry.