Abstract:
A semiconductor device operable to demodulate incident modulated electromagnetic radiation, the semiconductor device comprising: a pinned photodiode structure including a substrate of a first type, an implant layer of a second type disposed within the substrate, first and second auxiliary implant layers of the second type disposed within the substrate and each disposed adjacent to the implant layer of the second type, an implant layer of the first type disposed within the implant layer of the second type and extending into the first and second auxiliary implant layers of the second type, an insulator disposed on a surface of the substrate, and a photo-detection region; first and second transfer gates disposed on a surface of the insulator, the transfer gates being operable to generate a field within the substrate; and first and second floating diffusion implant layers of the second type disposed within the substrate.
Abstract:
An optical ranging system includes a support, a light emitter mounted on the support, and a time-of-flight (“TOF”) sensor chip mounted on the support. The TOF sensor chip, for example, includes at least one main pixel and at least one reference pixel in a semiconductor substrate. A barrier that is substantially non-transparent to light emitted by the light emitter separates the at least one reference pixel from the at least one main pixel. The optical ranging system also includes features for reducing optical cross-talk between the light emitter and the pixels of the TOF sensor.
Abstract:
An optoelectronic module operable to collect distance data via a time-of-flight mode and a time-of-flight-triangulation mode includes an illumination assembly and an imaging assembly. The imaging assembly includes at least one demodulation pixel operable to determine distance to an object via a time-of-flight mode and a time-of-flight-triangulation mode. Multi-path distance inaccuracies can be mitigated in some implementations.
Abstract:
Optoelectronic modules (100) are operable to distinguish between signals indicative of reflections from an object of interest and signals indicative of a spurious reflection. Various modules are operable to recognize spurious reflections by means of dedicated spurious-reflection detection pixels (126) and, in some cases, also to compensate for errors caused by spurious reflections.