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公开(公告)号：US10509145B2
公开(公告)日：2019-12-17
申请号：US15294078
申请日：2016-10-14
Inventor： Young Sam Park , Doo-Hee Cho , Jeong Ik Lee , Jonghee Lee , Seongdeok Ahn , Byoung Gon Yu , Nam Sung Cho
Abstract: Provided are an optical device and a manufacturing method thereof. The method of manufacturing an optical device may include providing a substrate structure, and depositing an array including curved structures on the substrate structure. The curved structures may include a crystalline organic compound.
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公开(公告)号：US10134992B2
公开(公告)日：2018-11-20
申请号：US15596659
申请日：2017-05-16
Inventor： Jaehyun Moon , Jong Tae Lim , Young Sam Park , Jin Wook Shin , Byoung Gon Yu , Hyunkoo Lee , Jong Chan Jeong , Nam Sung Cho , Doo-Hee Cho , Jun-Han Han
Abstract: Provided is a method for manufacturing an electronic device including a transparent conductive structure, the method including preparing a transparent electrode in which, among a first region and a second region, the first region is selectively surface-modified, preparing a mixed composition including a first composition and a second composition having a different polarity from the first composition, and applying the mixed composition onto the transparent electrode, wherein the applied mixed composition is disposed in the surface modified first region, and the mixed composition disposed in the first region is phase-separated into a first composition layer and a second composition layer disposed on the first composition layer.
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13.发明申请公开(公告)号：US20140010258A1
公开(公告)日：2014-01-09
申请号：US13780166
申请日：2013-02-28
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
IPC: G01N25/18
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Abstract translation: 本发明的概念涉及热导率测量装置和测量热导率的方法。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级，同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元，连接在第一阶段和第二阶段之间; 以及测量单元，测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境，本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化，所以可以提高测量的可靠性。
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Patent Agency Ranking
14.发明授权公开(公告)号：US12164183B2
公开(公告)日：2024-12-10
申请号：US17492387
申请日：2021-10-01
Inventor： Doo-Hee Cho , Byoung-Hwa Kwon , Young Sam Park , Jin Wook Shin , Nam Sung Cho , Hyunsu Cho
Abstract: Provided is a nano structure for controlling optical properties of an optical device. The nano structure includes a substrate, a surface modification layer provided on the substrate to modify surface energy of the substrate, and a capping layer provided on the surface modification layer. The capping layer includes a convex portion having a convex profile away from the surface modification layer and a concave portion that is in contact with the surface modification layer.
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公开(公告)号：US10789448B2
公开(公告)日：2020-09-29
申请号：US16035290
申请日：2018-07-13
Inventor： Young Sam Park , Jaehyun Moon , Seongdeok Ahn , Seung Youl Kang , Sung Haeng Cho , Byoung Gon Yu , Jeong Ik Lee , Jonghee Lee , Nam Sung Cho , Doo-Hee Cho , Hyunsu Cho
Abstract: The inventive concept provides an organic electronic device and a method of fabricating the same. The organic electronic device includes a flexible substrate configured to include a first region and a second region which are laterally spaced apart from each other, an organic light-emitting diode disposed in the first region of the flexible substrate, and a photodetector disposed in the second region of the flexible substrate, wherein the organic light-emitting diode and the photodetector are disposed on the same plane.
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16.发明授权公开(公告)号：US10374093B2
公开(公告)日：2019-08-06
申请号：US15812231
申请日：2017-11-14
Inventor： Doo-Hee Cho , Young Sam Park , Chunwon Byun , Byoung Gon Yu , Jonghee Lee , Hyunkoo Lee , Nam Sung Cho
IPC: H01L29/76 , H01L29/786 , H01L51/00 , H01L21/288 , H01L21/02 , H01L51/10 , H01L29/423 , H01L21/683 , H01L51/05 , H01L29/66
Abstract: Embodiments of the inventive concepts provide a method of fabricating a flexible substrate and the flexible substrate fabricated thereby. The method includes printing a gate catalyst pattern on a separation layer, forming a gate plating pattern on the gate catalyst pattern, forming a gate insulating layer on the gate plating pattern, printing a source catalyst pattern and a drain catalyst pattern spaced apart from each other on the gate insulating layer, and forming a source plating pattern and a drain plating pattern on the source catalyst pattern and the drain catalyst pattern, respectively.
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公开(公告)号：US09377421B2
公开(公告)日：2016-06-28
申请号：US14862678
申请日：2015-09-23
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
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公开(公告)号：US09377420B2
公开(公告)日：2016-06-28
申请号：US14861909
申请日：2015-09-22
Inventor： Younghoon Hyun , Young Sam Park , Moon Gyu Jang , Taehyoung Zyung
CPC classification number: G01N25/18
Abstract: The inventive concept relates to a thermal conductivity measuring device. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
Abstract translation: 本发明的概念涉及热导率测量装置。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级，同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元，连接在第一阶段和第二阶段之间; 以及测量单元，测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境，本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化，所以可以提高测量的可靠性。
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