公开(公告)号：US09768866B2

公开(公告)日：2017-09-19

申请号：US14797030

申请日：2015-07-10

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： hyoungjun Park ,  Kwon-Seob Lim ,  Hyun Seo Kang ,  Jaisang Koh ,  Keo-Sik Kim ,  Young Sun Kim ,  Jeong Eun Kim ,  Ji Hyoung Ryu ,  Eun Kyoung Jeon

IPC: G01J1/04 ,  H04B10/079

CPC classification number: H04B10/07957 ,  H04B10/07955

Abstract: An optical wavelength and optical power measurement device is provided. The optical wavelength and optical power measurement device includes: an input unit in which an optical connector that emits communication light of an infrared ray wavelength region is connected; a filter unit that separates the communication light of an infrared ray wavelength region and light of a visible ray wavelength region; a sensing unit that communicates with a path of the communication light of an infrared ray wavelength region of the filter unit and in which a signal of the communication light of an infrared ray wavelength region is input; and an inspection unit that communicates with a path of the light of the visible ray wavelength region of the filter unit and that inspects a surface of the optical connector.

公开(公告)号：US09534889B2

公开(公告)日：2017-01-03

申请号：US14505747

申请日：2014-10-03

Applicant: Electronics and Telecommunications Research Institute

Inventor： Jeong Eun Kim ,  Hyun Seo Kang ,  Hyoung Jun Park ,  Young Soon Heo ,  Keo Sik Kim ,  Eun Kyoung Jeon ,  Kwon Seob Lim ,  Young Sun Kim

IPC: G01B11/06 ,  G01B17/02

CPC classification number: G01B17/025 ,  G01B11/0666

Abstract: Provided is an apparatus that measures a thickness of a coating by selecting a wavelength of a laser based on a color of the coating using a contactless method using a photoacoustic effect and an interferometer, the apparatus including a pulsed laser source to irradiate a pulsed laser beam toward the coating, a continuous wave (CW) laser source to irradiate a CW laser beam toward the coating, a detector to detect an optical interference signal corresponding to the CW laser beam, and a signal processor to process the optical interference signal to calculate a thickness of the coating.

Abstract translation: 提供了一种通过使用光声效应和干涉仪的非接触式方法来选择基于涂层的颜色的激光的波长来测量涂层的装置，该装置包括用于照射脉冲激光束的脉冲激光源 向涂层提供连续波（CW）激光源，以朝向涂层照射CW激光束;检测器，用于检测对应于CW激光束的光学干涉信号;以及信号处理器，用于处理光学干涉信号以计算 涂层厚度。

公开(公告)号：US08730578B1

公开(公告)日：2014-05-20

申请号：US13782150

申请日：2013-03-01

Applicant: Electronics and Telecommunications Research Institute

Inventor： Young Soon Heo ,  Hyun Seo Kang ,  Young Sun Kim ,  Hyoung Jun Park ,  Kwon-Seob Lim ,  Keo-Sik Kim ,  Eun Kyoung Jeon

IPC: G02B17/00

CPC classification number: G02B19/0042 ,  G02B6/0006 ,  G02B6/06 ,  G02B6/262

Abstract: A sunlight coupler is provided, the sunlight coupler may include a beam integrator configured to concentrate beams of sunlight, which may be incident from a plurality of optical fibers, in the form of a single beam, a triplet lens focusing the concentrated beam on a specific position, and an optical fiber provided for transmission of the focused sunlight. The optical fiber may be a thermally-diffusion expand core fiber.

Abstract translation: 提供了一种太阳光耦合器，太阳光耦合器可以包括光束积分器，该光束积分器被配置为将单个光束形式的可能从多根光纤入射的太阳光束集中在一起，将聚光束聚焦在特定的光束上 位置，以及为聚焦太阳光的透过而设置的光纤。 光纤可以是热扩散膨胀芯纤维。