公开(公告)号：US20240405135A1

公开(公告)日：2024-12-05

申请号：US18388449

申请日：2023-11-09

Applicant: Apple Inc.

Inventor： Matthew T. Morea ,  Daniel Mahgerefteh ,  Dylan N. Rees ,  Mark A. Arbore ,  Romain F. Chevallier

IPC: H01L31/0232 ,  G01J1/02 ,  H01L31/0304 ,  H01L31/0392

Abstract: An electromagnetic radiation detectors includes anti-reflective epitaxial structures incorporated into an epitaxial stack of the electromagnetic radiation detector. An anti-reflective structures as described herein are grown between (and thereby connect) two lattice-matched epitaxial layers that have different refractive indices. The anti-reflective structure reduces Fresnel reflections that would otherwise occur if the two epitaxial layers were directly connected.

公开(公告)号：US20240102856A1

公开(公告)日：2024-03-28

申请号：US18234794

申请日：2023-08-16

Applicant: Apple Inc.

Inventor： Matthew A. Terrel ,  David S. Gere ,  Alexander F. Sugarbaker ,  Thomas C. Greening ,  Jason S. Pelc ,  Mark A. Arbore

IPC: G01J1/44 ,  G02B6/43

CPC classification number: G01J1/44 ,  G02B6/43 ,  G01J2001/444

Abstract: Embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. The optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. Each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. The optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.

公开(公告)号：US20230324286A1

公开(公告)日：2023-10-12

申请号：US18121427

申请日：2023-03-14

Applicant: Apple Inc.

Inventor： Jason S. Pelc ,  Mark A. Arbore ,  Matthew A. Terrel ,  Thomas C. Greening ,  Yongming Tu ,  Lucia Gan

IPC: G01N21/31

CPC classification number: G01N21/31

Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

公开(公告)号：US20220320168A1

公开(公告)日：2022-10-06

申请号：US17464550

申请日：2021-09-01

Applicant: Apple Inc.

Inventor： Daniel Mahgerefteh ,  Mark A. Arbore ,  Matthew T. Morea ,  Romain F. Chevallier ,  Yung-Yu Hsu

IPC: H01L27/146 ,  G01J5/08 ,  H01L31/0232

Abstract: An electromagnetic radiation detector pixel includes a set of epitaxial layers and a lens. The set of epitaxial layers defines an electromagnetic radiation absorber. The lens is directly bonded to the set of epitaxial layers.

公开(公告)号：US20190324203A1

公开(公告)日：2019-10-24

申请号：US16271833

申请日：2019-02-10

Applicant: APPLE INC.

Inventor： Igal I. Bayn ,  Andrew J. Sutton ,  Alexander Shpunt ,  Jason S. Pelc ,  Mark A. Arbore

IPC: G02B6/12 ,  G02B6/122 ,  G02B6/13

Abstract: An optoelectronic device includes a substrate, having a recess formed therein. An optical isolator is mounted in the recess. A laser includes a stack of epitaxial layers on the substrate and emits a beam of radiation toward the recess along a direction parallel to a surface of the substrate. A waveguide directs the beam emitted by the laser into the optical isolator.

公开(公告)号：US10295838B1

公开(公告)日：2019-05-21

申请号：US15267321

申请日：2016-09-16

Applicant: Apple Inc.

Inventor： Mark A. Arbore

IPC: G02B27/09 ,  G02B27/46 ,  G01N21/00 ,  G01N21/47 ,  G01N21/88 ,  G01N21/41 ,  G01N21/49 ,  G02B27/42

Abstract: A confocal inspection system can analyze light collected from a sample. For absorptive samples, it can be desirable to bin the collected light as a function of optical path length traversed in the sample. To perform this binning, the optical system can direct the collected light to a body having a surface that includes concentric annular portions that impart unique non-focusing angular redirections to respective portions of the collected light. In some examples, the annular portions are planar and have respective surface normals that are uniquely angled with respect to one another. In other examples, the annular portions are planar and parallel, and include respective zero-power, blazed diffraction gratings having unique combinations of blaze angle and blaze orientation with respect to one another. Light from each annular portion can be focused onto a respective lateral location at a detector plane.