Abstract:
In at least some embodiments, a tool may comprise a tool body and one or more tool components. The tool may further comprise tool electronics located within the tool body, wherein the tool electronics are operable to sense and store tool component characteristics and environmental characteristics. At least some of the tool electronics are operable, at least for one week, when exposed to temperatures of at least 200 Celsius. The tool electronics may be integrated circuits formed on a silicon carbide substrate or a silicon on sapphire substrate. One illustrative embodiment of the tool is a drill bit for employment in a high temperature drill well.
Abstract:
A downhole communication system including a plurality of addressed downhole devices, a plurality of remote devices, and a plurality of conductors. Each of the plurality of conductors is electrically conductively connected to at least one of the plurality of addressed downhole devices and at least one of the plurality of remote devices. The downhole communication system is configured such that at least one of the plurality of devices is able to receive and recognize encoded addresses and encoded data in an electrical signal transmitted to at least one of the plurality of conductors electrically conductively isolated from the device configured to be receptive to the electrical signal having the encoded addresses and encoded data.
Abstract:
A system for measuring power of a circuit on a printed circuit board (PCB) including first and second circuits, a power strip, a power plane, and a calibration strip. The power strip is connected to the power plane to the first circuit, is embedded in the PCB during the manufacturing process, and also has at least two vias for measuring a voltage drop. The calibration strip is also embedded in the PCB during the manufacturing process and has at least two vias for measuring a voltage drop. The second circuit is configured to measure a voltage drop across the power strip as a first voltage and a voltage drop across the calibration strip as a second voltage, and to calculate the power being fed to the first circuit based on the first voltage and the second voltage.
Abstract:
An aluminum over silicon barrier extends over the lateral edges of an integrated circuit chip into adjacent scribe lines forming an edge barrier.
Abstract:
High temperature imaging devices are disclosed. In one embodiment, the imaging device comprises an array of photosensitive elements fabricated on an insulator substrate, and an information storage component coupled to the array. The information storage component stores data representing one or more light patterns detected by the array. The light patterns may be images or spectral patterns. The insulator substrate may be a sapphire or spinel substrate. Alternatively, the substrate may be silicon carbide or an insulated silicon substrate. In at least some embodiments, a processor is integrated on the same substrate as the array.
Abstract:
A system for measuring power of a circuit on a printed circuit board (PCB) including first and second circuits, a power strip, a power plane, and a calibration strip. The power strip is connected to the power plane to the first circuit, is embedded in the PCB during the manufacturing process, and also has at least two vias for measuring a voltage drop. The calibration strip is also embedded in the PCB during the manufacturing process and has at least two vias for measuring a voltage drop. The second circuit is configured to measure a voltage drop across the power strip as a first voltage and a voltage drop across the calibration strip as a second voltage, and to calculate the power being fed to the first circuit based on the first voltage and the second voltage.