公开(公告)号：US07514914B2

公开(公告)日：2009-04-07

申请号：US11786760

申请日：2007-04-12

Applicant: James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

Inventor： James E. Hopkins ,  Michael Peter Costello ,  Herbert Tsai ,  Ching-Too Chen

IPC: G01R31/02

CPC classification number: G01R31/2893 ,  G01R31/31718 ,  G01R31/31905

Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.

Abstract translation: 描述了具有多个电引线的用于测试系统级封装（SIP）器件的装置。 该设备采用行业标准的JEDEC托盘，同时对这些托盘中的所有设备进行测试。 说明性实施例的装置包括测试蜂巢，其包括：多个对应于托盘中的小区数目的测试电路; 以及多组测试触点，所述测试触点组中的每一个耦合到所述测试电路中的一个并且被定向成接合设置在相应的一个单元中的SIP设备的多个电触头，所述测试配置单元 可操作以同时电测试由蜂巢接合的每个托盘中的所有SIP设备，而不从托盘移除SIP设备。

公开(公告)号：US07472042B2

公开(公告)日：2008-12-30

申请号：US11486309

申请日：2006-07-14

Applicant: Hung-Chang Chang ,  Yaomin Lin

Inventor： Hung-Chang Chang ,  Yaomin Lin

IPC: G01B11/24 ,  G01B11/00

CPC classification number: G01B11/2441

Abstract: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data points depicting a relationship of surface height versus illumination intensity is generated. In the beginning, a first data point with greatest illumination intensity is selected from the interference data points on the waveform. Then, a second data point is selected from the data points on the waveform within a predetermined range centered at the first data point to have the waveform showing best quality of symmetry. Then, a peak of a fringe defined by the second data point and its neighboring data points is estimated by using phase compensating approach.

Abstract translation: 提供了使用通过分离器照射样品表面和参考表面的宽带宽光源的表面轮廓测量方法。 通过以恒定步长改变样品表面和参考表面之间的距离，产生了由描绘表面高度与照射强度的关系的干涉数据点组成的波形的干涉图。 在开始时，从波形上的干扰数据点选择具有最大照明强度的第一数据点。 然后，在以第一数据点为中心的预定范围内的波形上的数据点中选择第二数据点，以使具有最佳对称质量的波形。 然后，通过使用相位补偿方法估计由第二数据点及其相邻数据点限定的条纹的峰值。

公开(公告)号：US20080266797A1

公开(公告)日：2008-10-30

申请号：US11982658

申请日：2007-11-01

Applicant: I-Shih Tseng

Inventor： I-Shih Tseng

IPC: H05K7/20

CPC classification number: H01L23/467 ,  G06F1/20 ,  H01L2924/0002 ,  H01L2924/00

Abstract: It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρumd)/μ≧2,500; with ρ being the fluid density, um being the free-stream fluid velocity, d being the pipe distance or diameter, μ being the fluid viscosity. Since the airflow produces air turbulence, it causes the frequent heat exchanges in the air. It also causes the obvious temperature changes within the different layers of air. Therefore, it increases tremendously, the efficiency of dissipating the heat. It requires only the input of the air. The operation is simple and it allows the usage of even higher heat generating devices. Thus it promotes the alternative usage of this top mount heatsink device within the installation of circuit board components.

Abstract translation: 它是一种顶部安装表面气流散热器，利用由气隙隔开的上部顶壁，与加热装置（微处理器）的上表面一起产生气流。 这是一个简单的设备，使用雷诺方程Re =（rhou m> d）/ mu = 2500; 其中rho是流体密度，u> m是自由流体流速，d是管道距离或直径，μ是流体粘度。 由于气流产生空气湍流，导致空气中频繁的热交换。 它也会导致不同层次空气中明显的温度变化。 因此，它大大增加了散热的效率。 它只需要空气的输入。 操作简单，可以使用更高的发热装置。 因此，它可以在电路板组件的安装中促进该顶部安装散热装置的替代使用。

公开(公告)号：US07423764B2

公开(公告)日：2008-09-09

申请号：US11373288

申请日：2006-03-13

Applicant: Chieh-Cheng Liao ,  Yao-Min Lin ,  Huang-Chang Chang ,  Wei-Che Chang

Inventor： Chieh-Cheng Liao ,  Yao-Min Lin ,  Huang-Chang Chang ,  Wei-Che Chang

IPC: G01B11/02

CPC classification number: G01B9/02048 ,  G01B9/02027 ,  G01B9/02072 ,  G01B9/02079 ,  G01B9/0209 ,  G01B11/2441

Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

Abstract translation: 一种集成的干涉扫描方法，主要用于集成VSI和PSI测量的各自优点，从而实现了高精度和无限测量范围的特点。 特别地，可以利用VSI测量和PSI测量之间的斜率校正因子和位移校正因子来执行VSI和PSI的高度数据阵列的积分计算，使得扫描过程可以通过仅使用 干涉扫描系统的宽带光源，从而减少干扰扫描系统的误差和复杂性。

公开(公告)号：US20080109541A1

公开(公告)日：2008-05-08

申请号：US11798667

申请日：2007-05-16

Applicant: Warren Hsu

Inventor： Warren Hsu

IPC: G06F15/177

CPC classification number: G01R31/2834 ,  G01R31/31907 ,  H04L29/12216 ,  H04L41/0803 ,  H04L43/50 ,  H04L61/2007

Abstract: A method for automatic dispatching IP addresses to each testing apparatus in a testing system, according to this method, the testing system can automatically dispatch IP addresses to the each respective apparatus. The each testing apparatus comprises a testing circuit board for positioning a circuit element/device under test thereon; a network interface device, which is installed on the testing circuit board and stores an internal code; and a memory device connected to the testing circuit board, respectively. Thus the testing system can control each testing apparatus, so as to avoid labor consumption caused by repetitive dispatch of the IP addresses, as well as the loss due to shutdown of the product lines. Therefore, this method can solve the above-mentioned problems simultaneously.

Abstract translation: 根据这种方法，在测试系统中为每个测试设备自动分配IP地址的方法，测试系统可以自动地将IP地址分配到每个相应的设备。 每个测试装置包括用于定位被测电路元件/设备的测试电路板; 网络接口设备，安装在测试电路板上并存储内部代码; 以及分别连接到测试电路板的存储器件。 因此，测试系统可以控制每个测试设备，以避免由于IP地址的重复调度而导致的劳动力消耗以及由于产品线的关闭而导致的损失。 因此，该方法可以同时解决上述问题。

公开(公告)号：US20080013101A1

公开(公告)日：2008-01-17

申请号：US11486311

申请日：2006-07-14

Applicant: Yaomin Lin ,  Hung-Chang Chang

Inventor： Yaomin Lin ,  Hung-Chang Chang

IPC: G01B11/02

CPC classification number: G01B11/2441 ,  H01J9/42 ,  H01J9/50 ,  Y02W30/828

Abstract: A repairing method for a surface profile is provided. The intensity on the waveform of the interference diagrams or the existence of envelope on the waveform of the interference diagram are used to decide whether the respected pixel is located in a dark area on the surface profile or not. Then, mark the pixel located in the dark area. Afterward, repair the marked pixel by using the surrounding effective pixels on the surface profile.

Abstract translation: 提供了表面轮廓的修复方法。 使用干涉图的波形上的强度或干涉图的波形上的包络的存在来确定被尊重的像素是否位于表面轮廓上的暗区域中。 然后，标记位于黑暗区域的像素。 之后，通过使用表面轮廓上的周围有效像素来修复标记的像素。

公开(公告)号：US20080013100A1

公开(公告)日：2008-01-17

申请号：US11486309

申请日：2006-07-14

Applicant: Hung-Chang Chang ,  Yaomin Lin

Inventor： Hung-Chang Chang ,  Yaomin Lin

IPC: G01B11/02

CPC classification number: G01B11/2441

Abstract: A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interference diagram with a waveform composed of interference data points depicting a relationship of surface height versus illumination intensity is generated. In the beginning, a first data point with greatest illumination intensity is selected from the interference data points on the waveform. Then, a second data point is selected from the data points on the waveform within a predetermined range centered at the first data point to have the waveform showing best quality of symmetry. Then, a peak of a fringe defined by the second data point and its neighboring data points is estimated by using phase compensating approach.

Abstract translation: 提供了使用通过分离器照射样品表面和参考表面的宽带宽光源的表面轮廓测量方法。 通过以恒定步长改变样品表面和参考表面之间的距离，产生了由描绘表面高度与照射强度的关系的干涉数据点组成的波形的干涉图。 在开始时，从波形上的干扰数据点选择具有最大照明强度的第一数据点。 然后，在以第一数据点为中心的预定范围内的波形上的数据点中选择第二数据点，以使具有最佳对称质量的波形。 然后，通过使用相位补偿方法估计由第二数据点及其相邻数据点限定的条纹的峰值。

公开(公告)号：US20070019186A1

公开(公告)日：2007-01-25

申请号：US11188423

申请日：2005-07-25

Applicant: Hsin-Yueh Sung ,  Bing-Shien Chung ,  Wen-Chi Lo ,  Chin-Chiang Liao ,  Miao-Shen Liu

Inventor： Hsin-Yueh Sung ,  Bing-Shien Chung ,  Wen-Chi Lo ,  Chin-Chiang Liao ,  Miao-Shen Liu

IPC: G01N21/88

CPC classification number: G01N21/8806 ,  G01N21/95684 ,  G01N2021/8845 ,  G01N2021/95638

Abstract: An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.

Abstract translation: 用于测试对象的特征检测的装置包括至少一个光源模块和至少一个图像捕获单元。 光源模块提供光以照亮测试对象的测试区域，并且包括基板，一组发光部件和光聚焦单元。 发光部件安装在基板上，用于沿大致横向于基板的平行方向发光。 光聚焦单元设置在发光元件与被测对象之间，接收由发光元件发出的光，并将光聚焦在被测对象物的测试区域上。 图像捕获单元在测试区域捕获测试对象的图像。

公开(公告)号：US20060212246A1

公开(公告)日：2006-09-21

申请号：US11082475

申请日：2005-03-16

Applicant: Charles Chuang ,  Chih-Chiao Chang ,  Chia-Jung Chang ,  Li-Han Chang

Inventor： Charles Chuang ,  Chih-Chiao Chang ,  Chia-Jung Chang ,  Li-Han Chang

IPC: G06F19/00

CPC classification number: G01R31/367

Abstract: A signal transmission device includes a set of first nodes, each of which is connected electrically to a respective one of devices under test, a second node connected electrically to a testing equipment, a set of mechanical relays, each of which interconnects the second node and a respective first node, a controller coupled electrically to the mechanical relays and operable so as to actuate the mechanical relays in sequence, and a defect-detecting module coupled electrically to the second node, the controller and the mechanical relays. The defect-detecting module is operable so as to detect the presence of abnormal operation during actuation of one of the mechanical relays and to generate an alarm signal upon detecting the presence of the abnormal operation.

Abstract translation: 信号传输设备包括一组第一节点，每个第一节点电连接到被测设备中的相应一个，与测试设备电连接的第二节点，一组机械中继器，每个节点互连第二节点和 相应的第一节点，与机械继电器电连接并且可操作以依次致动机械继电器的控制器，以及电连接到第二节点，控制器和机械继电器的缺陷检测模块。 缺陷检测模块可操作以便在致动机械继电器之一期间检测异常操作的存在，并且在检测到异常操作的存在时产生报警信号。

公开(公告)号：US20060132768A1

公开(公告)日：2006-06-22

申请号：US11019821

申请日：2004-12-22

Applicant: Charles Chuang ,  Chia-Jung Chang

Inventor： Charles Chuang ,  Chia-Jung Chang

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/2866

Abstract: An optical spectrometer includes an input module, an optical sensing device, a light splitter, and a processing device. The input module includes an orifice unit through which an incident light beam passes. The optical sensing device includes a two-dimensional array of sensing cells arranged into a plurality of rows and columns. The light splitter splits the incident light beam from the input module into at least one wavelength component of a light band, and projects the wavelength component to the optical sensing device. The optical sensing device is disposed such that the wavelength component projected thereon is inclined at a predetermined angle relative to a columnar direction of the sensing cells. The processing device is coupled to the optical sensing device for processing electrical signals generated by the sensing cells.

Abstract translation: 光谱仪包括输入模块，光学感测装置，光分离器和处理装置。 输入模块包括入口光束通过的孔单元。 光学感测装置包括布置成多个行和列的感测单元的二维阵列。 光分路器将来自输入模块的入射光束分成光带的至少一个波长分量，并将波长分量投影到光学感测装置。 光学传感装置被布置成使得其上投影的波长分量相对于感测单元的柱状方向倾斜预定角度。 处理装置耦合到光学感测装置，用于处理由感测单元产生的电信号。