ABSOLUTE LINEAR-IN-K SPECTROMETER

    公开(公告)号:US20220221339A1

    公开(公告)日:2022-07-14

    申请号:US17603487

    申请日:2020-04-03

    Abstract: A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.

Patent Agency Ranking