公开(公告)号：US20180276811A1

公开(公告)日：2018-09-27

申请号：US15726402

申请日：2017-10-06

Applicant: Test Research, Inc.

Inventor： Kuang-Pu WEN ,  Wen-Ming WU ,  Chun-Yen HUANG

IPC: G06T7/00 ,  G01N21/95 ,  G01N21/956 ,  H04N5/247

CPC classification number: G06T7/0008 ,  G01N21/8851 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/845 ,  G01N2021/8867 ,  G01N2021/9513 ,  G01N2021/95638 ,  G01N2201/0484 ,  G06T2207/30141 ,  G06T2207/30148 ,  H04N5/247

Abstract: An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.