公开(公告)号：US20250156310A1

公开(公告)日：2025-05-15

申请号：US18946517

申请日：2024-11-13

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Junha LEE ,  Kyoungtae KANG ,  Hyunsuk KANG ,  Dongho SHIN ,  Kang Yoon LEE

IPC: G06F12/02 ,  G06F13/40

Abstract: A memory device includes data pads that are connected to an external memory controller, a ZQ pad that is connected to an external resistor, data drivers and receivers that are connected to the data pads and output first data signals to the data pads or receive second data signals from the data pads, and a ZQ calibrator that is connected to the ZQ pad. The memory device performs ZQ calibration based on a voltage of the ZQ pad, generates ZQ codes as a result of the ZQ calibration, and provides the ZQ codes to the data drivers and receivers. The ZQ calibrator performs a first-type ZQ calibration in response to a command received from the external memory controller and performs a second-type ZQ calibration without the command being received from the external memory controller.

公开(公告)号：US20250047265A1

公开(公告)日：2025-02-06

申请号：US18441084

申请日：2024-02-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Eunji AN ,  Kyoungtae KANG ,  Jehoon KIM ,  Byungjoo OH ,  Hyunsuk KANG

IPC: H03K3/011 ,  H03K3/03

Abstract: A drive signal supply device includes an oscillation circuit, a drive signal generation circuit, and a control circuit. The oscillation circuit includes a plurality of oscillators each including inverters and outputs a plurality of oscillation signals. A switching characteristic of each of the inverters included in one of the plurality of oscillators is different from a switching characteristic of each of the inverters included in another of the plurality of oscillators. The control circuit detects a process corner of the semiconductor device based on the plurality of oscillation signals to generate a control signal. The drive signal generation circuit generates a drive signal of a semiconductor device based on the control signal.

公开(公告)号：US20230138561A1

公开(公告)日：2023-05-04

申请号：US17938214

申请日：2022-10-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongho SHIN ,  Jungjune PARK ,  Kyoungtae KANG ,  Chiweon YOON ,  Junha LEE ,  Byunghoon JEONG

IPC: G11C7/10 ,  H03K19/00

Abstract: An apparatus and method for ZQ calibration, including determining a strong driver circuit and a weak driver circuit, which are related to an input/output (I/O) circuit connected to a signal pin, at power-up of the I/O circuit; providing a ZQ calibration code related to a sweep code to one from among the strong driver circuit and the weak driver circuit according to ZQ calibration conditions; and providing a ZQ calibration code related to a fixed code to an unselected circuit, thereby adjusting a termination resistance of the signal pin.