公开(公告)号：US20170013725A1

公开(公告)日：2017-01-12

申请号：US15270940

申请日：2016-09-20

申请人： Massachusetts Institute of Technology

发明人： Dmitry Tolpin ,  James H. Kelly ,  Roger M. Maurais

IPC分类号： H05K3/30 ,  H05K1/11 ,  H05K1/18

CPC分类号： H05K3/301 ,  H01L2224/16225 ,  H01L2924/10253 ,  H01L2924/351 ,  H01L2924/381 ,  H05K1/111 ,  H05K1/18 ,  H05K1/181 ,  H05K3/30 ,  H05K3/303 ,  H05K3/3436 ,  H05K2201/068 ,  H05K2201/094 ,  H05K2201/09418 ,  H05K2201/09427 ,  H05K2201/10242 ,  Y02P70/611 ,  Y10T29/4913 ,  Y10T29/49133 ,  H01L2924/00

摘要： Reliability is improved for the mechanical electrical connection formed between a grid array device, such as a pin grid array device (PGA) or a column grid array device (CGA), and a substrate such as a printed circuit board (PCB). Between adjacent PCB pads, a spacing pattern increases toward the periphery of the CGA, creating a misalignment between pads and columns. As part of the assembly method, columns align with the pads, resulting in column tilt that increases from the center to the periphery of the CGA. An advantage of this tilt is that it reduces the amount of contractions and expansions of columns during thermal cycling, thereby increasing the projected life of CGA. Another advantage of the method is that it reduces shear stress, further increasing the projected life of the CGA.

摘要翻译： 对于诸如针阵列阵列器件（PGA）或列格栅阵列器件（CGA）的栅格阵列器件和诸如印刷电路板（PCB）的衬底之间形成的机械电连接，可靠性得到改善。 在相邻的PCB焊盘之间，间隔图案朝向CGA的周边增加，导致焊盘和柱之间的未对准。 作为组装方法的一部分，列与焊盘对准，导致从CGA的中心到外围增加的列倾斜。 这种倾斜的一个优点是在热循环期间减少了柱的收缩量和膨胀量，从而增加了CGA的预计使用寿命。 该方法的另一个优点是降低了剪切应力，进一步提高了CGA的寿命。

公开(公告)号：US20130313007A1

公开(公告)日：2013-11-28

申请号：US13901398

申请日：2013-05-23

申请人： Massachusetts Institute of Technology

发明人： Dmitry Tolpin ,  James H. Kelly ,  Roger M. Maurais

IPC分类号： H05K1/11 ,  H05K3/30

CPC分类号： H05K3/301 ,  H01L2224/16225 ,  H01L2924/10253 ,  H01L2924/351 ,  H01L2924/381 ,  H05K1/111 ,  H05K1/18 ,  H05K1/181 ,  H05K3/30 ,  H05K3/303 ,  H05K3/3436 ,  H05K2201/068 ,  H05K2201/094 ,  H05K2201/09418 ,  H05K2201/09427 ,  H05K2201/10242 ,  Y02P70/611 ,  Y10T29/4913 ,  Y10T29/49133 ,  H01L2924/00

摘要： Reliability is improved for the mechanical electrical connection formed between a grid array device, such as a pin grid array device (PGA) or a column grid array device (CGA), and a substrate such as a printed circuit board (PCB). Between adjacent PCB pads, a spacing pattern increases toward the periphery of the CGA, creating a misalignment between pads and columns. As part of the assembly method, columns align with the pads, resulting in column tilt that increases from the center to the periphery of the CGA. An advantage of this tilt is that it reduces the amount of contractions and expansions of columns during thermal cycling, thereby increasing the projected life of CGA. Another advantage of the method is that it reduces shear stress, further increasing the projected life of the CGA.

摘要翻译： 对于诸如针阵列阵列器件（PGA）或列格栅阵列器件（CGA）的栅格阵列器件和诸如印刷电路板（PCB）的衬底之间形成的机械电连接，可靠性得到改善。 在相邻的PCB焊盘之间，间隔图案朝向CGA的周边增加，导致焊盘和柱之间的未对准。 作为组装方法的一部分，列与焊盘对准，导致从CGA的中心到外围增加的列倾斜。 这种倾斜的一个优点是在热循环期间减少了柱的收缩量和膨胀量，从而增加了CGA的预计使用寿命。 该方法的另一个优点是降低了剪切应力，进一步提高了CGA的寿命。

公开(公告)号：US10433429B2

公开(公告)日：2019-10-01

申请号：US15270940

申请日：2016-09-20

申请人： Massachusetts Institute of Technology

发明人： James H. Kelly ,  Dmitry Tolpin ,  Roger M. Maurais

IPC分类号： H05K3/30 ,  H05K1/11 ,  H05K1/18 ,  H05K3/34

摘要： A method is presented that improves reliability for the mechanical electrical connection formed between a grid array device, such as a pin grid array device (PGA) or a column grid array device (CGA), and a substrate such as a printed circuit board (PCB). Between adjacent PCB pads, the method increases a spacing pattern toward the periphery of the CGA, creating a misalignment between pads and columns. As part of the method, columns align with the pads, resulting in column tilt that increases from the center to the periphery of the CGA. An advantage of the method is that the column tilt reduces the amount of contractions and expansions of columns during thermal cycling, thereby increasing the projected life of CGA. Another advantage of the method is that it reduces shear stress, further increasing the projected life of the CGA.

公开(公告)号：US09491859B2

公开(公告)日：2016-11-08

申请号：US13901398

申请日：2013-05-23

申请人： Massachusetts Institute of Technology

发明人： Dmitry Tolpin ,  James H. Kelly ,  Roger M. Maurais

IPC分类号： H05K1/11 ,  H05K1/18 ,  H05K3/30 ,  H05K3/34

CPC分类号： H05K3/301 ,  H01L2224/16225 ,  H01L2924/10253 ,  H01L2924/351 ,  H01L2924/381 ,  H05K1/111 ,  H05K1/18 ,  H05K1/181 ,  H05K3/30 ,  H05K3/303 ,  H05K3/3436 ,  H05K2201/068 ,  H05K2201/094 ,  H05K2201/09418 ,  H05K2201/09427 ,  H05K2201/10242 ,  Y02P70/611 ,  Y10T29/4913 ,  Y10T29/49133 ,  H01L2924/00

摘要： Reliability is improved for the mechanical electrical connection formed between a grid array device, such as a pin grid array device (PGA) or a column grid array device (CGA), and a substrate such as a printed circuit board (PCB). Between adjacent PCB pads, a spacing pattern increases toward the periphery of the CGA, creating a misalignment between pads and columns. As part of the assembly method, columns align with the pads, resulting in column tilt that increases from the center to the periphery of the CGA. An advantage of this tilt is that it reduces the amount of contractions and expansions of columns during thermal cycling, thereby increasing the projected life of CGA. Another advantage of the method is that it reduces shear stress, further increasing the projected life of the CGA.

摘要翻译： 对于诸如针阵列阵列器件（PGA）或列格栅阵列器件（CGA）的栅格阵列器件和诸如印刷电路板（PCB）的衬底之间形成的机械电连接，可靠性得到改善。 在相邻的PCB焊盘之间，间隔图案朝向CGA的周边增加，导致焊盘和柱之间的未对准。 作为组装方法的一部分，列与焊盘对准，导致从CGA的中心到外围增加的列倾斜。 这种倾斜的一个优点是在热循环期间减少了柱的收缩量和膨胀量，从而增加了CGA的预计使用寿命。 该方法的另一个优点是降低了剪切应力，进一步提高了CGA的寿命。