发明授权
- 专利标题: Grid arrays with enhanced fatigue life
- 专利标题(中): 具有增强疲劳寿命的网格阵列
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申请号: US13901398申请日: 2013-05-23
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公开(公告)号: US09491859B2公开(公告)日: 2016-11-08
- 发明人: Dmitry Tolpin , James H. Kelly , Roger M. Maurais
- 申请人: Massachusetts Institute of Technology
- 申请人地址: US MA Cambridge
- 专利权人: Massachusetts Institute of Technology
- 当前专利权人: Massachusetts Institute of Technology
- 当前专利权人地址: US MA Cambridge
- 代理机构: Hamilton, Brook, Smith & Reynolds, P.C.
- 主分类号: H05K1/11
- IPC分类号: H05K1/11 ; H05K1/18 ; H05K3/30 ; H05K3/34
摘要:
Reliability is improved for the mechanical electrical connection formed between a grid array device, such as a pin grid array device (PGA) or a column grid array device (CGA), and a substrate such as a printed circuit board (PCB). Between adjacent PCB pads, a spacing pattern increases toward the periphery of the CGA, creating a misalignment between pads and columns. As part of the assembly method, columns align with the pads, resulting in column tilt that increases from the center to the periphery of the CGA. An advantage of this tilt is that it reduces the amount of contractions and expansions of columns during thermal cycling, thereby increasing the projected life of CGA. Another advantage of the method is that it reduces shear stress, further increasing the projected life of the CGA.
公开/授权文献
- US20130313007A1 Grid Arrays with Enhanced Fatigue Life 公开/授权日:2013-11-28
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