Abstract:
A detection device includes a substrate and a die. The substrate provides a first voltage. The die is disposed adjacent to the substrate. The die includes a plurality of resistor paths, a selection circuit, an ADC (Analog-to-Digital Converter), and a digital circuit. The selection circuit selects one of the resistor paths as a target path. The target path provides a second voltage. The ADC generates a digital signal according to the first voltage and the second voltage. The digital circuit processes the digital signal.
Abstract:
A dynamic current sink includes the following elements. A voltage comparator compares a reference voltage with a second control signal from an LDO (Low Dropout Linear Regulator) to generate a first control signal. A first transistor selectively pulls down a voltage at a first node according to the first control signal. The inverter is coupled between the first node and a second node. An NAND gate has a first input terminal coupled to a second transistor and a third node, a second input terminal coupled to the second node, and an output terminal coupled to a fourth node. A capacitor is coupled between the fourth node and a fifth node. A resistor is coupled between the fifth node and a ground voltage. A third transistor has a control terminal coupled to the fifth node, and selectively draws a discharge current from an output node of the LDO.