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公开(公告)号:US20210028869A1
公开(公告)日:2021-01-28
申请号:US17068300
申请日:2020-10-12
Applicant: Huawei Technologies Co., Ltd.
Inventor: Bo Hao , Xiaopeng Li , Xubo Zhao
Abstract: A test method includes transmitting, by a transmit device, N signal sequences using a transmit antenna array, obtaining, from a test device, a phase offset that is of each signal sequence in the signal sequences and that is generated after the signal sequence passes through a channel, adjusting an initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through the channel, to obtain a target test signal in-phase superposed at the test device, where the target test signal includes a plurality of signal sequences obtained by separately performing phase adjustment on the initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through a respective channel, and transmitting the target test signal using the transmit antenna array.
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公开(公告)号:US11121464B2
公开(公告)日:2021-09-14
申请号:US16806769
申请日:2020-03-02
Applicant: HUAWEI TECHNOLOGIES CO., LTD.
Inventor: Guangding Ge , Xubo Zhao , Deshuang Zhao
Abstract: This application discloses a correction and testing system, comprising a first phased array, a second phased array, and a test instrument, wherein the first phased array comprises a first radio frequency RF channel, the test instrument is configured to: determine, based on a coupling signal, an amplitude deviation value and a phase deviation value that correspond to the first RF channel; if the amplitude deviation value and the phase deviation value satisfy a preset error correction condition, correct an amplitude coefficient and a phase coefficient that correspond to the first RF channel to obtain a target amplitude coefficient and a target phase coefficient; and measure performance indicator parameters of the first phased array by using the target amplitude coefficient and the target phase coefficient. The correction and testing system can improve test efficiency, reducing a floor area, and lowering costs.
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