APPARATUS, SYSTEM, AND METHOD FOR RECONFIGURING AN ARRAY OF STORAGE ELEMENTS
    1.
    发明申请
    APPARATUS, SYSTEM, AND METHOD FOR RECONFIGURING AN ARRAY OF STORAGE ELEMENTS 有权
    用于重新构建存储元件阵列的装置,系统和方法

    公开(公告)号:US20140258775A1

    公开(公告)日:2014-09-11

    申请号:US14286712

    申请日:2014-05-23

    Abstract: Apparatuses, systems, and methods are disclosed for reconfiguring an array of storage elements. A storage element error module is configured to determine that one or more storage elements in an array of storage elements are in error. An array of storage elements stores a first ECC block and first parity data generated from the first ECC block. A data reconfiguration module is configured to generate a second ECC block comprising at least a portion of data of a first ECC block. A new configuration storage module is configured to store a second ECC block and associated second parity data on fewer storage elements than a number of storage elements in an array.

    Abstract translation: 公开了用于重新配置存储元件阵列的装置,系统和方法。 存储元件错误模块被配置为确定存储元件阵列中的一个或多个存储元件是错误的。 一组存储元件存储从第一ECC块生成的第一ECC块和第一奇偶校验数据。 数据重配置模块被配置为生成包括第一ECC块的数据的至少一部分的第二ECC块。 新的配置存储模块被配置为在比阵列中的多个存储元件更少的存储元件上存储第二ECC块和相关联的第二奇偶校验数据。

    Apparatus, system, and method for reconfiguring an array of storage elements
    2.
    发明授权
    Apparatus, system, and method for reconfiguring an array of storage elements 有权
    用于重新配置存储元件阵列的装置,系统和方法

    公开(公告)号:US08495460B2

    公开(公告)日:2013-07-23

    申请号:US13645353

    申请日:2012-10-04

    Abstract: An apparatus, system, and method are disclosed for reconfiguring an array of solid-state storage elements. The method includes determining that one or more storage elements are unavailable to store data. The storage elements are configured in an array of N storage elements that each store a portion of a first ECC chunk and P storage elements that store first parity data corresponding to the first ECC chunk. The method includes generating a second ECC chunk comprising at least a portion of the data of the first ECC chunk. The method includes storing the second ECC chunk and associated second parity data across (N+P)−Z storage elements where 1≦Z≦P.

    Abstract translation: 公开了用于重新配置固态存储元件阵列的装置,系统和方法。 该方法包括确定一个或多个存储元件不可用于存储数据。 存储元件被配置为N个存储元件的阵列,每个N个存储元件存储第一ECC块的一部分和存储对应于第一ECC块的第一奇偶校验数据的P个存储元件。 该方法包括生成包括第一ECC块的数据的至少一部分的第二ECC组块。 该方法包括在(N + P)-Z个存储元件中存储第二ECC块和相关联的第二奇偶校验数据,其中1 @ Z @ P。

    APPARATUS, SYSTEM, AND METHOD FOR RECONFIGURING AN ARRAY OF STORAGE ELEMENTS
    3.
    发明申请
    APPARATUS, SYSTEM, AND METHOD FOR RECONFIGURING AN ARRAY OF STORAGE ELEMENTS 有权
    用于重新构建存储元件阵列的装置,系统和方法

    公开(公告)号:US20130036327A1

    公开(公告)日:2013-02-07

    申请号:US13645353

    申请日:2012-10-04

    Abstract: An apparatus, system, and method are disclosed for reconfiguring an array of solid-state storage elements. The method includes determining that one or more storage elements are unavailable to store data. The storage elements are configured in an array of N storage elements that each store a portion of a first ECC chunk and P storage elements that store first parity data corresponding to the first ECC chunk. The method includes generating a second ECC chunk comprising at least a portion of the data of the first ECC chunk. The method includes storing the second ECC chunk and associated second parity data across (N+P)−Z storage elements where 1≦Z≦P.

    Abstract translation: 公开了用于重新配置固态存储元件阵列的装置,系统和方法。 该方法包括确定一个或多个存储元件不可用于存储数据。 存储元件被配置为N个存储元件的阵列,每个N个存储元件存储第一ECC块的一部分和存储对应于第一ECC块的第一奇偶校验数据的P个存储元件。 该方法包括生成包括第一ECC块的数据的至少一部分的第二ECC组块。 该方法包括在(N + P)-Z个存储元件中存储第二ECC块和相关的第二奇偶校验数据,其中1≦̸ Z≦̸ P。

    APPARATUS, SYSTEM, AND METHOD FOR TESTING PHYSICAL REGIONS IN A SOLID-STATE STORAGE DEVICE
    4.
    发明申请
    APPARATUS, SYSTEM, AND METHOD FOR TESTING PHYSICAL REGIONS IN A SOLID-STATE STORAGE DEVICE 有权
    用于测试固态储存装置中的物理区域的装置,系统和方法

    公开(公告)号:US20130036262A1

    公开(公告)日:2013-02-07

    申请号:US13625765

    申请日:2012-09-24

    Abstract: An apparatus, system, and method are disclosed for testing physical regions in a solid-state storage device. The method includes defining a physical storage region on solid-state storage media of a solid-state storage device. The physical storage region includes a subset of storage capacity of the solid-state storage media. The method includes implementing the physical storage region definition on a storage controller such that memory operations are bounded to the physical storage region. The method includes testing wear of solid-state storage media associated with the physical storage region using memory operations bounded to the physical storage region.

    Abstract translation: 公开了用于测试固态存储设备中的物理区域的装置,系统和方法。 该方法包括在固态存储设备的固态存储介质上定义物理存储区域。 物理存储区域包括固态存储介质的存储容量的子集。 该方法包括在存储控制器上实现物理存储区域定义,使得存储器操作被限制到物理存储区域。 该方法包括使用界定到物理存储区域的存储器操作测试与物理存储区域相关联的固态存储介质的磨损。

    Apparatus, system, and method for reconfiguring an array of storage elements
    6.
    发明授权
    Apparatus, system, and method for reconfiguring an array of storage elements 有权
    用于重新配置存储元件阵列的装置,系统和方法

    公开(公告)号:US08738991B2

    公开(公告)日:2014-05-27

    申请号:US13907479

    申请日:2013-05-31

    Abstract: Apparatuses, systems, and methods are disclosed for reconfiguring an array of storage elements. A storage element error module is configured to determine that one or more storage elements in an array of storage elements are in error. An array of storage elements stores a first ECC block and first parity data generated from the first ECC block. A data reconfiguration module is configured to generate a second ECC block comprising at least a portion of data of a first ECC block. A new configuration storage module is configured to store a second ECC block and associated second parity data on fewer storage elements than a number of storage elements in an array.

    Abstract translation: 公开了用于重新配置存储元件阵列的装置,系统和方法。 存储元件错误模块被配置为确定存储元件阵列中的一个或多个存储元件是错误的。 一组存储元件存储从第一ECC块生成的第一ECC块和第一奇偶校验数据。 数据重配置模块被配置为生成包括第一ECC块的数据的至少一部分的第二ECC块。 新的配置存储模块被配置为在比阵列中的多个存储元件更少的存储元件上存储第二ECC块和相关联的第二奇偶校验数据。

    Apparatus, system, and method for testing physical regions in a solid-state storage device
    7.
    发明授权
    Apparatus, system, and method for testing physical regions in a solid-state storage device 有权
    用于测试固态存储设备中的物理区域的装置,系统和方法

    公开(公告)号:US08725938B2

    公开(公告)日:2014-05-13

    申请号:US13625765

    申请日:2012-09-24

    Abstract: An apparatus, system, and method are disclosed for testing physical regions in a solid-state storage device. The method includes defining a physical storage region on solid-state storage media of a solid-state storage device. The physical storage region includes a subset of storage capacity of the solid-state storage media. The method includes implementing the physical storage region definition on a storage controller such that memory operations are bounded to the physical storage region. The method includes testing wear of solid-state storage media associated with the physical storage region using memory operations bounded to the physical storage region.

    Abstract translation: 公开了用于测试固态存储设备中的物理区域的装置,系统和方法。 该方法包括在固态存储设备的固态存储介质上定义物理存储区域。 物理存储区域包括固态存储介质的存储容量的子集。 该方法包括在存储控制器上实现物理存储区域定义,使得存储器操作被限制到物理存储区域。 该方法包括使用界定到物理存储区域的存储器操作测试与物理存储区域相关联的固态存储介质的磨损。

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