In an embodiment, an electronic device comprises a shared electrical over-stress (EOS) protection circuit. The shared EOS protection circuit may be coupled between a power input terminal and ground terminal to provide an EOS current path from the power input terminal to the ground terminal, and coupled between the output terminal and the ground terminal to provide an EOS current path from the output terminal to the ground terminal. The electronic device may also include a power interruption mitigation circuit to provide power to the electronic device during interruptions or fluctuations in external power.