- 专利标题: Semiconductor device and method of manufacturing the same
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申请号: US14886314申请日: 2015-10-19
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公开(公告)号: US09748377B2公开(公告)日: 2017-08-29
- 发明人: Tzu-Ming Huang , Shen-Ping Wang , Lieh-Chuan Chen , Chih-Heng Shen , Po-Tao Chu
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 申请人地址: TW
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW
- 代理机构: Hauptman Ham, LLP
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L29/78 ; H01L29/417 ; H01L29/08 ; H01L29/423 ; H01L29/06 ; H01L29/10
摘要:
A semiconductor device includes a gate structure, a source region and a drain region. The source region and the drain region are on opposite sides of the gate structure. The source region includes a first region of a first conductivity type and a second region of a second conductivity type. The second conductivity type is opposite to the first conductivity type. The first region is between the second region and the gate structure. The second region includes at least one projection protruding into the first region and toward the gate structure.
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