Invention Grant
- Patent Title: Charged particle-beam device
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Application No.: US15035265Application Date: 2014-11-05
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Publication No.: US09653256B2Publication Date: 2017-05-16
- Inventor: Akira Ikegami , Hideto Dohi , Hideyuki Kazumi , Yoichi Ose , Naomasa Suzuki , Momoyo Enyama , Ryuji Nishi , Akio Takaoka
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2013-232668 20131111
- International Application: PCT/JP2014/079308 WO 20141105
- International Announcement: WO2015/068717 WO 20150514
- Main IPC: H01J3/26
- IPC: H01J3/26 ; H01J37/28 ; H01J37/147 ; H01J37/153 ; H01J3/12 ; H01J37/14

Abstract:
Provided is a charged-particle-beam device capable of simultaneously cancelling out a plurality of aberrations caused by non-uniform distribution of the opening angle and energy of a charged particle beam. The charged-particle-beam device is provided with an aberration generation lens for generating an aberration due to the charged particle beam passing off-axis, and a corrective lens for causing the trajectory of the charged particle beam to converge on the main surface of an objective lens irrespective of the energy of the charged particle beam. The main surface of the corrective lens is disposed at a crossover position at which a plurality of charged particle beams having differing opening angles converge after passing through the aberration generation lens.
Public/Granted literature
- US20160300690A1 Charged-Particle-Beam Device Public/Granted day:2016-10-13
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