发明授权
- 专利标题: X-ray detectors
- 专利标题(中): X光检测器
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申请号: US13853166申请日: 2013-03-29
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公开(公告)号: US09588238B2公开(公告)日: 2017-03-07
- 发明人: Young Kim , Jun-su Lee , Sun-il Kim , Jae-chul Park , Dae-kun Yoon , Sang-wook Han
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 优先权: KR10-2012-0033339 20120330
- 主分类号: G01T1/24
- IPC分类号: G01T1/24 ; H01L27/146
摘要:
An X-ray detector may include a silicon substrate including a first area and a second area; a plurality of pixels in the first area configured to detect X-rays; a control pad in the second area configured to supply a common control signal to the plurality of pixels; and/or a power supply pad in the first area configured to supply a power supply voltage to groups of pixels grouped from among the plurality of pixels.
公开/授权文献
- US20130256545A1 X-RAY DETECTORS 公开/授权日:2013-10-03
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