Invention Grant
US09488921B2 Lithography apparatus, an apparatus for providing setpoint data, a device manufacturing method, a method of calculating setpoint data and a computer program
有权
平版印刷装置,用于提供设定点数据的装置,装置制造方法,计算设定点数据的方法和计算机程序
- Patent Title: Lithography apparatus, an apparatus for providing setpoint data, a device manufacturing method, a method of calculating setpoint data and a computer program
- Patent Title (中): 平版印刷装置,用于提供设定点数据的装置,装置制造方法,计算设定点数据的方法和计算机程序
-
Application No.: US14356357Application Date: 2012-11-15
-
Publication No.: US09488921B2Publication Date: 2016-11-08
- Inventor: Patricius Aloysius Jacobus Tinnemans , Wouter Frans Willem Mulckhuyse
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2012/072765 WO 20121115
- International Announcement: WO2013/083383 WO 20130613
- Main IPC: G03B27/32
- IPC: G03B27/32 ; G03B27/54 ; G03F7/20

Abstract:
An exposure apparatus configured to project each of a plurality of radiation beams onto a respective location on a target, the plurality of radiation beams forming a desired dose pattern via a plurality of spot exposures, the nominal position of a characteristic point in the dose distribution of each of the spot exposures lying at points defining a first grid. The apparatus has, or is provided data from, a controller configured to: calculate a target intensity value for each of the plurality of radiation beams to expose the target to the desired dose pattern, the calculation using as input a rasterized representation of the desired dose pattern, the rasterized representation including a dose value defined at each of a plurality of points on a second grid, the first and second grids having the same geometry, and control the exposure apparatus to emit beams with the target intensity values.
Public/Granted literature
Information query