发明授权
- 专利标题: Temperature-based adaptive erase or program parallelism
- 专利标题(中): 基于温度的自适应擦除或程序并行
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申请号: US13787799申请日: 2013-03-06
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公开(公告)号: US09224478B2公开(公告)日: 2015-12-29
- 发明人: Richard K. Eguchi , Jon S. Choy , Chen He , Kelly K. Taylor
- 申请人: Richard K. Eguchi , Jon S. Choy , Chen He , Kelly K. Taylor
- 申请人地址: US TX Austin
- 专利权人: FREESCALE SEMICONDUCTOR, INC.
- 当前专利权人: FREESCALE SEMICONDUCTOR, INC.
- 当前专利权人地址: US TX Austin
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C16/10 ; G11C7/04 ; G11C16/14 ; G11C16/30 ; G11C16/34
摘要:
A method includes, in one implementation, performing a memory operation to place memory cells of a memory array to a first logic state using a voltage of a charge pump. A portion of the operation is performed on the memory cells using the voltage of the charge pump. A temperature of the memory array is compared to a threshold. If the temperature is above a reference level, a load on the charge pump is reduced by providing the voltage to only a reduced number of memory cells.
公开/授权文献
- US20140254285A1 Temperature-Based Adaptive Erase or Program Parallelism 公开/授权日:2014-09-11
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