发明授权
US09202815B1 Method for processing a carrier, a carrier, and a split gate field effect transistor structure
有权
用于处理载波,载波和分离栅场效应晶体管结构的方法
- 专利标题: Method for processing a carrier, a carrier, and a split gate field effect transistor structure
- 专利标题(中): 用于处理载波,载波和分离栅场效应晶体管结构的方法
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申请号: US14309968申请日: 2014-06-20
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公开(公告)号: US09202815B1公开(公告)日: 2015-12-01
- 发明人: Kerstin Kaemmer , Thomas Bertrams , Henning Feick , Olaf Storbeck , Matthias Schmeide
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: INFINEON TECHNOLOGIES AG
- 当前专利权人: INFINEON TECHNOLOGIES AG
- 当前专利权人地址: DE Neubiberg
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L27/112 ; H01L21/265 ; H01L21/02 ; H01L29/51 ; H01L29/423 ; H01L29/36 ; H01L29/167
摘要:
According to various embodiments, a method for processing a carrier may include: doping a carrier with fluorine such that a first surface region of the carrier is fluorine doped and a second surface region of the carrier is at least one of free from the fluorine doping or less fluorine doped than the first surface region; and oxidizing the carrier to grow a first gate oxide layer from the first surface region of the carrier with a first thickness and simultaneously from the second surface region of the carrier with a second thickness different from the first thickness.
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