Invention Grant
- Patent Title: Nitride semiconductor template and method of manufacturing the same
- Patent Title (中): 氮化物半导体模板及其制造方法
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Application No.: US12650465Application Date: 2009-12-30
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Publication No.: US08648387B2Publication Date: 2014-02-11
- Inventor: Jenq-Dar Tsay , Po-Chun Liu
- Applicant: Jenq-Dar Tsay , Po-Chun Liu
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: H01L31/102
- IPC: H01L31/102 ; H01L21/20 ; H01L21/36

Abstract:
A nitride semiconductor template and a manufacturing method thereof are provided. The nitride semiconductor template includes a carrier substrate with a first thermal expansion coefficient, a nitride semiconductor layer with a second thermal expansion coefficient different from the first thermal expansion coefficient, and a bonding layer. The nitride semiconductor layer disposed on the carrier substrate is at least 10 μm in thickness. A ratio of a dislocation density of the nitride semiconductor layer at a first surface to that at a second surface is from 0.1 to 10. The bonding layer is disposed between the carrier substrate and the nitride semiconductor layer to adhere the nitride semiconductor layer onto the carrier substrate. The second surface is near an interface between the nitride semiconductor layer and the bonding layer, and the first surface is 10 μm from the second surface.
Public/Granted literature
- US20110156047A1 NITRIDE SEMICONDUCTOR TEMPLATE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2011-06-30
Information query
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