发明授权
US07804040B2 Physical vapor deposition plasma reactor with arcing suppression
有权
具有电弧抑制的物理气相沉积等离子体反应器
- 专利标题: Physical vapor deposition plasma reactor with arcing suppression
- 专利标题(中): 具有电弧抑制的物理气相沉积等离子体反应器
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申请号: US11438496申请日: 2006-05-22
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公开(公告)号: US07804040B2公开(公告)日: 2010-09-28
- 发明人: Karl M. Brown , Semyon Sherstinksy , Vineet H. Mehta , Wei W. Wang , John A. Pipitone , Kurt J. Ahmann , Armando Valverde, Jr.
- 申请人: Karl M. Brown , Semyon Sherstinksy , Vineet H. Mehta , Wei W. Wang , John A. Pipitone , Kurt J. Ahmann , Armando Valverde, Jr.
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Law Office of Robert M. Wallace
- 主分类号: B23K9/00
- IPC分类号: B23K9/00
摘要:
A physical vapor deposition reactor includes a vacuum chamber with a sidewall, a ceiling and a retractable wafer support pedestal near a floor of the chamber, and a vacuum pump coupled to the chamber, the retractable wafer support pedestal having an internal electrode and a grounded base with a conductive annular flange extending from the base. A metal sputter target at the ceiling is energized by a high voltage D.C. source. The reactor has an RF plasma source power generator with a frequency suitable for exciting kinetic electrons is coupled to either the sputter target or to the internal electrode of the pedestal. A removable shield protects the sidewall and is grounded by plural compressible conductive tabs dispersed at generally uniform intervals on the annular flange and engaging a bottom edge of the shield whenever the retractable wafer support pedestal is in an unretracted position, each of the uniform intervals being less than a wavelength corresponding to the frequency of the RF plasma source power generator.
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