发明授权
US06847542B2 SRAM cell and integrated memory circuit using the same 失效
SRAM单元和集成存储电路使用相同

SRAM cell and integrated memory circuit using the same
摘要:
An SRAM cell comprising a first inverter comprising a first load element and a first driver NMOSFET, a second inverter comprising a second load element and a second driver NMOSFET and having input and output terminals cross-coupled to output and input terminals of the first inverter, respectively, a first transfer gate NMOSFET having a current path inserted between the first inverter and a first bit line and a gate connected to a word line, and a second transfer gate NMOSFET having a current path inserted between the second inverter and a second bit line and a gate connected to the word line, wherein a current drivability of the first inverter and the first transfer gate NMOSFET for the first bit line is set to be larger than that of the second inverter and the second transfer gate NMOSFET for the second bit line.
公开/授权文献
信息查询
0/0