- 专利标题: SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
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申请号: US18361917申请日: 2023-07-31
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公开(公告)号: US20230386974A1公开(公告)日: 2023-11-30
- 发明人: Jen-Chun Liao , Sung-Yueh Wu , Chien-Ling Hwang , Ching-Hua Hsieh
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L23/15 ; H01L21/768 ; H01L23/498 ; H01L21/56 ; H01L23/538 ; H01L23/31
摘要:
A semiconductor package and a manufacturing method are provided. The semiconductor package includes a carrier substrate, a through substrate via (TSV), a first conductive pattern, and an encapsulated die. The TSV penetrates through the carrier substrate and includes a first portion and a second portion connected to the first portion, the first portion includes a first slanted sidewall with a first slope, the second portion includes a second slanted sidewall with a second slope, and the first slope is substantially milder than the second slope. The first conductive pattern is disposed on the carrier substrate and connected to the first portion of the TSV. The encapsulated die is disposed on the carrier substrate and electrically coupled to the TSV through the first conductive pattern.
公开/授权文献
- US12040255B2 Semiconductor package and manufacturing method thereof 公开/授权日:2024-07-16
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