- 专利标题: MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMPROVED FOCUS SETTING TAKING INTO ACCOUNT AN IMAGE PLANE TILT
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申请号: US17582504申请日: 2022-01-24
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公开(公告)号: US20220246388A1公开(公告)日: 2022-08-04
- 发明人: Nicole Rauwolf , Nico Kaemmer , Michael Behnke , Ingo Mueller , Dirk Zeidler , Arne Thoma , Christof Riedesel , Gunther Scheunert
- 申请人: Carl Zeiss MultiSEM GmbH
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss MultiSEM GmbH
- 当前专利权人: Carl Zeiss MultiSEM GmbH
- 当前专利权人地址: DE Oberkochen
- 优先权: DE102021200799.6 20210129
- 主分类号: H01J37/21
- IPC分类号: H01J37/21 ; H01J37/26 ; G01N21/95
摘要:
A multiple particle beam microscope and an associated method set a desired focal plane with an optical resolution and set a telecentric irradiation with the plurality of the primary beams. A method determines an optimal setting plane, into which an object surface is brought. Further, a system provides an improved resolution and telecentric irradiation for a large number of primary beams. Targeted selection and targeted individual influencing of individual primary beams and/or a mechanism means for influencing the plurality of primary beams in collective fashion can be implemented.
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