- 专利标题： ML-ENABLED ASSURED MICROELECTRONICS MANUFACTURING: A TECHNIQUE TO MITIGATE HARDWARE TROJAN DETECTION
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申请号： US17244183申请日： 2021-04-29
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公开(公告)号： US20210342991A1公开(公告)日： 2021-11-04
- 发明人: Ajey Poovannummoottil JACOB , John DAMOULAKIS , Akhilesh JAISWAL , Devanand Krishna SHENOY , Andrew RITTENBACH
- 申请人： UNIVERSITY OF SOUTHERN CALIFORNIA
- 申请人地址： US CA LOS ANGELES
- 专利权人： UNIVERSITY OF SOUTHERN CALIFORNIA
- 当前专利权人： UNIVERSITY OF SOUTHERN CALIFORNIA
- 当前专利权人地址： US CA LOS ANGELES
- 主分类号： G06T7/00
- IPC分类号： G06T7/00 ; G06T7/30 ; G06T3/40 ; G06T11/00 ; H01J37/28 ; H01J37/244
摘要：
A method for assuring that integrated circuits are free of malicious circuit insertions and/or IC design modifications through mask swapping/addition is provided. The method includes a step of comparing 3D tomographic images constructed from design GDS to the 3D tomographic images constructed from in-line fab metrology data.
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