Invention Application
- Patent Title: FINE NEEDLE ELASTOGRAPHY DEVICE AND SYSTEM FOR THE MEASUREMENT OF MATERIAL PROPERTIES
-
Application No.: US15503371Application Date: 2015-08-10
-
Publication No.: US20170231499A1Publication Date: 2017-08-17
- Inventor: James K. Gimzewski , Shivani Sharma , Paul R. Wilkinson , Nagesh Ragavendra , JianYu Rao , M. Dayan J. Wickramaratne
- Applicant: James K. GIMZEWSKI , Shivani SHARMA , Paul WILKINSON , Nagesh RAGAVENDRA , JianYu RAO , M. Dayan J. WICKRAMARATNE , THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Applicant Address: US CA Oakland
- Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
- Current Assignee Address: US CA Oakland
- International Application: PCT/US2015/044469 WO 20150810
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B10/00 ; A61B10/02 ; A61B5/06

Abstract:
In one aspect, an elastography system includes an elastography device and a position sensing device connected to the elastography device. The elastography device includes a housing, a probing element removably attached to the housing, and a force sensor attached within the housing, where the force sensor is connected to the probing element. In another aspect, an elastography) method includes inserting a probing element into a material, producing, by a force sensor connected to a base of the probing element a signal indicative of a force applied to the probing element upon insertion of the probing element into the material, and based on the signal, deriving a mapping of spatial variations of a material property within the material.
Information query