Invention Application
- Patent Title: TRANSISTOR AND SEMICONDUCTOR STRUCTURE
- Patent Title (中): 晶体管和半导体结构
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Application No.: US14454727Application Date: 2014-08-08
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Publication No.: US20140346616A1Publication Date: 2014-11-27
- Inventor: Min-Chuan Tsai , Hsin-Fu Huang , Chi-Mao Hsu , Chin-Fu Lin , Chien-Hao Chen , Wei-Yu Chen , Chi-Yuan Sun , Ya-Hsueh Hsieh , Tsun-Min Cheng
- Applicant: UNITED MICROELECTRONICS CORP.
- Main IPC: H01L29/49
- IPC: H01L29/49 ; H01L29/78 ; H01L29/51

Abstract:
A semiconductor structure includes a work function metal layer, a (work function) metal oxide layer and a main electrode. The work function metal layer is located on a substrate. The (work function) metal oxide layer is located on the work function metal layer. The main electrode is located on the (work function) metal oxide layer. A semiconductor process forming said semiconductor structure is also provided.
Public/Granted literature
- US09076784B2 Transistor and semiconductor structure Public/Granted day:2015-07-07
Information query
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