发明申请
US20080293170A1 METHOD FOR EVALUATING A GATE INSULATION FILM CHARACTERISTIC FOR USE IN A SEMICONDUCTOR DEVICE 失效
评估用于半导体器件的栅绝缘膜特性的方法

  • 专利标题: METHOD FOR EVALUATING A GATE INSULATION FILM CHARACTERISTIC FOR USE IN A SEMICONDUCTOR DEVICE
  • 专利标题(中): 评估用于半导体器件的栅绝缘膜特性的方法
  • 申请号: US12183704
    申请日: 2008-07-31
  • 公开(公告)号: US20080293170A1
    公开(公告)日: 2008-11-27
  • 发明人: Masayasu MiyataMasamitsu Uehara
  • 申请人: Masayasu MiyataMasamitsu Uehara
  • 申请人地址: JP Tokyo
  • 专利权人: SEIKO EPSON CORPORATION
  • 当前专利权人: SEIKO EPSON CORPORATION
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2003-421655 20031218; JP2004-219192 20040727
  • 主分类号: H01L21/66
  • IPC分类号: H01L21/66
METHOD FOR EVALUATING A GATE INSULATION FILM CHARACTERISTIC FOR USE IN A SEMICONDUCTOR DEVICE
摘要:
A gate insulating film 3 is formed of an insulative inorganic material containing silicon and oxygen as a main material. The gate insulating film 3 contains hydrogen atoms. A part of the absorbance of infrared radiation of which wave number is in the range of 830 to 900 cm−1 is less than both the absorbance of infrared radiation at the wave number of 830 cm−1 and the absorbance of infrared radiation at the wave number of 900 cm−1 when the insulating film to which an electric field has never been applied is measured by means of Fourier Transform Infrared Spectroscopy at room temperature. Further, in the case where the absolute value of the difference between the absorbance of infrared radiation at the wave number of 830 cm−1 and the absorbance of infrared radiation at the wave number of 770 cm−1 is defined as A and the absolute value of the difference between the absorbance of infrared radiation at the wave number of 900 cm−1 and the absorbance of infrared radiation at the wave number of 990 cm−1 is defined as B, then A and B satisfy the relation: A/B is 1.8 or more.
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