Invention Application
US20050195658A1 Magnetoresistive random access memory with high current density
有权
具有高电流密度的磁阻随机存取存储器
- Patent Title: Magnetoresistive random access memory with high current density
- Patent Title (中): 具有高电流密度的磁阻随机存取存储器
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Application No.: US11062926Application Date: 2005-02-23
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Publication No.: US20050195658A1Publication Date: 2005-09-08
- Inventor: Ricardo Sousa , Bernard Dieny , Olivier Redon
- Applicant: Ricardo Sousa , Bernard Dieny , Olivier Redon
- Applicant Address: FR Paris F-75752 FR Paris Cedex F-75794
- Assignee: Commissariat a I'Energie Atomique,Centre National de la Recherche Scientifique
- Current Assignee: Commissariat a I'Energie Atomique,Centre National de la Recherche Scientifique
- Current Assignee Address: FR Paris F-75752 FR Paris Cedex F-75794
- Priority: FR0402354 20040305
- Main IPC: G11C11/15
- IPC: G11C11/15 ; G11C11/16 ; H01L21/8246 ; H01L27/105 ; H01L27/22 ; G11C16/06

Abstract:
The memory comprises, on a semi-conducting substrate, a matrix of cells arranged in lines and columns and each designed to store an information bit. Each cell of a column comprises a magnetic tunnel junction having a line terminal and a column terminal respectively connected to a line conductor and, by means of a transistor, to a first column conductor associated to said column and to a first adjacent column. A gate of the transistor is connected to a gate conductor. The column terminal of each tunnel junction of said column is connected, by means of an additional transistor, to a second column conductor associated to said column and to a second adjacent column. A gate of the additional transistor is connected to an additional gate conductor. The two transistors associated to a cell can have a common electrode.
Public/Granted literature
- US07626221B2 Magnetoresistive random access memory with high current density Public/Granted day:2009-12-01
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