- 专利标题: Epitaxial oxide plug for strained transistors
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申请号: US17569643申请日: 2022-01-06
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公开(公告)号: US11757037B2公开(公告)日: 2023-09-12
- 发明人: Karthik Jambunathan , Biswajeet Guha , Anupama Bowonder , Anand S. Murthy , Tahir Ghani
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Schwabe, Williamson & Wyatt, P.C.
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L21/8234 ; H01L27/088 ; H01L27/092 ; H01L29/423
摘要:
Epitaxial oxide plugs are described for imposing strain on a channel region of a proximate channel region of a transistor. The oxide plugs form epitaxial and coherent contact with one or more source and drain regions adjacent to the strained channel region. The epitaxial oxide plugs can be used to either impart strain to an otherwise unstrained channel region (e.g., for a semiconductor body that is unstrained relative to an underlying buffer layer), or to restore, maintain, or increase strain within a channel region of a previously strained semiconductor body. The epitaxial crystalline oxide plugs have a perovskite crystal structure in some embodiments.
公开/授权文献
- US20220131007A1 EPITAXIAL OXIDE PLUG FOR STRAINED TRANSISTORS 公开/授权日:2022-04-28
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