- 专利标题: Memory device including pass transistors in memory tiers
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申请号: US17027399申请日: 2020-09-21
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公开(公告)号: US11417671B2公开(公告)日: 2022-08-16
- 发明人: Toru Tanzawa
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman Lundberg & Woessner, P.A.
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; H01L27/11526 ; H01L27/11524 ; H01L27/1157 ; H01L27/11556 ; H01L27/11582 ; G11C16/26 ; G11C16/10 ; H01L27/11573 ; H01L27/11575 ; G11C8/12 ; G11C16/08
摘要:
Some embodiments include apparatuses and methods of using such apparatuses. One of the apparatuses includes a semiconductor material, a pillar extending through the semiconductor material, a select gate located along a first portion of the pillar, memory cells located along a second portion of the pillar, and transistors coupled to the select gate through a portion of the semiconductor material. The transistors include sources and drains formed from portions of the semiconductor material. The transistors include gates that are electrically uncoupled to each other.
公开/授权文献
- US20210035995A1 MEMORY DEVICE INCLUDING PASS TRANSISTORS IN MEMORY TIERS 公开/授权日:2021-02-04
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