- 专利标题: Packaged semiconductor devices for high voltage with die edge protection
-
申请号: US16996742申请日: 2020-08-18
-
公开(公告)号: US11417579B2公开(公告)日: 2022-08-16
- 发明人: Woochan Kim , Vivek Arora , Anindya Poddar
- 申请人: Texas Instruments Incorporated
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Dawn Jos; Charles A. Brill; Frank D. Cimino
- 主分类号: H01L23/31
- IPC分类号: H01L23/31 ; H01L23/29 ; H01L23/00 ; H01L23/495 ; H01L21/78 ; H01L21/56
摘要:
In a described example a device includes: a first corner formed between a circuit side surface of a semiconductor die and a first sidewall formed with a first depth extending along a side of the semiconductor die from the circuit side surface; a ledge having a planar surface formed parallel to the circuit side surface of the semiconductor die formed at the first depth from the circuit side surface at the first corner, and being perpendicular to the first sidewall; a second corner formed by an intersection of the planar surface of the ledge and a scribe lane sidewall of the semiconductor die, forming a second sidewall perpendicular to the circuit side surface; and portions of the circuit side surface of the semiconductor die, the first corner, the first sidewall, and the planar surface of the ledge covered by a passivation layer.
公开/授权文献
信息查询
IPC分类: