Invention Grant
- Patent Title: Methods for forming structures with desired crystallinity for MRAM applications
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Application No.: US15438420Application Date: 2017-02-21
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Publication No.: US11133460B2Publication Date: 2021-09-28
- Inventor: Lin Xue , Jaesoo Ahn , Mahendra Pakala , Chi Hong Ching , Rongjun Wang
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L43/08 ; H01L43/10 ; H01F10/14 ; H01F10/32

Abstract:
Embodiments of the disclosure provide methods and apparatus for fabricating magnetic tunnel junction (MTJ) structures on a substrate in for spin-transfer-torque magnetoresistive random access memory (STT-MRAM) applications. In one example, a film stack utilized to form a magnetic tunnel junction structure on a substrate includes a pinned layer disposed on a substrate, wherein the pinned layer comprises multiple layers including at least one or more of a Co containing layer, Pt containing layer, Ta containing layer, an Ru containing layer, an optional structure decoupling layer disposed on the pinned magnetic layer, a magnetic reference layer disposed on the optional structure decoupling layer, a tunneling barrier layer disposed on the magnetic reference layer, a magnetic storage layer disposed on the tunneling barrier layer, and a capping layer disposed on the magnetic storage layer.
Public/Granted literature
- US20170170393A1 METHODS FOR FORMING STRUCTURES WITH DESIRED CRYSTALLINITY FOR MRAM APPLICATIONS Public/Granted day:2017-06-15
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