发明授权
- 专利标题: Ion implanter
-
申请号: US16821318申请日: 2020-03-17
-
公开(公告)号: US11062880B2公开(公告)日: 2021-07-13
- 发明人: Hiroshi Matsushita , Ryota Ohnishi
- 申请人: SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD.
- 申请人地址: JP Tokyo
- 专利权人: SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD.
- 当前专利权人: SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD.
- 当前专利权人地址: JP Tokyo
- 代理机构: Michael Best & Friedrich LLP
- 优先权: JPJP2019-051014 20190319
- 主分类号: H01J37/317
- IPC分类号: H01J37/317 ; H01J37/20 ; H01J37/09 ; G21K1/10 ; H01J37/147 ; H01J37/304 ; H01J37/30
摘要:
An ion implanter includes: a main body which includes a plurality of units which are disposed along a beamline along which an ion beam is transported, and a substrate transferring/processing unit which is disposed farthest downstream of the beamline, and has a neutron ray source in which a neutron ray is generated due to collision of a ultrahigh energy ion beam; an enclosure which at least partially encloses the main body; and a neutron ray scattering member which is disposed at a position where a neutron ray which is emitted from the neutron ray source is incident in a direction in which a distance from the neutron ray source to the enclosure is equal to or less than a predetermined value.
公开/授权文献
- US20200303163A1 ION IMPLANTER 公开/授权日:2020-09-24
信息查询