- 专利标题: Memory device and method of operation
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申请号: US16574669申请日: 2019-09-18
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公开(公告)号: US10937501B2公开(公告)日: 2021-03-02
- 发明人: Shigekazu Yamada
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman Lundberg & Woessner, P.A.
- 主分类号: G11C16/08
- IPC分类号: G11C16/08 ; G11C16/30 ; G11C16/04 ; G11C16/14 ; G11C16/26 ; G11C16/10 ; G11C5/14 ; G11C16/32 ; G11C11/56
摘要:
Discussed herein are systems and methods for charging an access line to a nonvolatile memory cell during a standby state, such as to prevent or mitigate standby-state charge loss. An embodiment of a memory device comprises a memory cell, a string driver circuit, and a charging circuit. The string driver circuit is coupled to the memory cell via a local word line, and has a common p-well. The charging circuit, in response to a voltage of a global word line of the memory device falling below a reference voltage during a standby state, couple a supply voltage to the common p-well of the string driver circuit to charge the global word line to a positive bias potential. The memory device includes a leakage compensation circuit to compensate for the junction leakage.
公开/授权文献
- US20200013467A1 MEMORY DEVICE AND METHOD OF OPERATION 公开/授权日:2020-01-09
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