- 专利标题: Nonvolatile memory including duty correction circuit and storage device including the nonvolatile memory
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申请号: US16668685申请日: 2019-10-30
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公开(公告)号: US10937474B2公开(公告)日: 2021-03-02
- 发明人: Jung-june Park , Jeong-don Ihm , Byung-hoon Jeong , Eun-ji Kim , Ji-yeon Shin , Young-don Choi
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2017-0097815 20170801
- 主分类号: G11C7/22
- IPC分类号: G11C7/22 ; G11C16/32 ; G11C7/10 ; G11C16/26 ; H03K3/017 ; H03K5/156
摘要:
Provided is a nonvolatile memory including a clock pin configured to receive an external clock signal during a duty correction circuit training period; a plurality of memory chips configured to perform a duty correction operation on an internal clock signal based on the external clock signal, the plurality of memory chips configured to perform the duty correction operation in parallel during the training period; and an input/output pin commonly connected to the plurality of memory chips, wherein each of the plurality of memory chips includes: a duty correction circuit (DCC) configured to perform the duty correction operation on the internal clock signal; and an output buffer connected between an output terminal of the DCC and the input/output pin.
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