发明授权
- 专利标题: Characterizing electronic component parameters including on-chip variations and moments
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申请号: US16193803申请日: 2018-11-16
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公开(公告)号: US10789406B1公开(公告)日: 2020-09-29
- 发明人: Shiva Raja , Igor Keller , Ling Wang
- 申请人: Cadence Design Systems, Inc.
- 申请人地址: US CA San Jose
- 专利权人: Cadence Design Systems, Inc.
- 当前专利权人: Cadence Design Systems, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Foley & Lardner LLP
- 主分类号: G06F30/3323
- IPC分类号: G06F30/3323 ; G06F30/30 ; G06F30/367 ; G06F30/3312 ; G06F111/04 ; G06F111/10 ; G06F111/20 ; G06F119/12
摘要:
The present embodiments are generally directed to electronic circuit design and verification and more particularly to techniques for characterizing electronic components within an electronic circuit design for use in verification. In one or more embodiments, an adaptive sensitivity based analysis is used to build an adaptive equation to represent the timing response surface for an electronic component. With the adaptive surface response built, a sample-based evaluation yields highly accurate extraction of electronic component timing parameters including on-chip variation information such as sigma and moments.
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