- 专利标题: Half density ferroelectric memory and operation
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申请号: US16417004申请日: 2019-05-20
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公开(公告)号: US10783949B2公开(公告)日: 2020-09-22
- 发明人: Scott J. Derner , Charles L. Ingalls
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Holland & Hart LLP
- 主分类号: G11C11/22
- IPC分类号: G11C11/22 ; G11C7/06 ; G11C7/00 ; G11C7/14 ; G11C11/4099 ; G11C11/16 ; G11C11/56
摘要:
Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A memory array may be operated in a half density mode, in which a subset of the memory cells is designated as reference memory cells. Each reference memory cell may be paired to an active memory cell and may act as a reference signal when sensing the active memory cell. Each pair of active and reference memory cells may be connected to a single access line. Sense components (e.g., sense amplifiers) associated with reference memory cells may be deactivated in half density mode. The entire memory array may be operated in half density mode, or a portion of the array may operate in half density mode and the remainder of the array may operate in full density mode.
公开/授权文献
- US20190333564A1 HALF DENSITY FERROELECTRIC MEMORY AND OPERATION 公开/授权日:2019-10-31
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