- 专利标题: Methods of forming staircase-shaped connection structures of three-dimensional semiconductor devices
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申请号: US15910583申请日: 2018-03-02
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公开(公告)号: US10211053B2公开(公告)日: 2019-02-19
- 发明人: Jung-Ik Oh , Daehyun Jang , Ha-Na Kim , Kyoungsub Shin
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel, P.A.
- 优先权: KR10-2014-0016653 20140213
- 主分类号: H01L21/027
- IPC分类号: H01L21/027 ; H01L27/11556 ; H01L21/306 ; H01L27/24 ; H01L21/308 ; H01L27/11582 ; H01L27/11575 ; H01L45/00 ; H01L27/11521 ; H01L25/00 ; H01L25/065
摘要:
Provided is a staircase-shaped connection structure of a three-dimensional semiconductor device. The device includes an electrode structure on a substrate, the electrode structure including an upper staircase region, a lower staircase region, and a buffer region therebetween. The electrode structure includes horizontal electrodes sequentially stacked on the substrate, the horizontal electrodes include a plurality of pad regions constituting a staircase structure of each of the upper and lower staircase regions, and the buffer region has a width that is larger than that of each of the pad regions.
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