Invention Grant
- Patent Title: Method for forming copper material over substrate
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Application No.: US15694354Application Date: 2017-09-01
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Publication No.: US10079177B1Publication Date: 2018-09-18
- Inventor: Ko-Wei Lin , Ying-Lien Chen , Chun-Ling Lin , Huei-Ru Tsai , Hung-Miao Lin , Sheng-Yi Su , Tzu-Hao Liu
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/768 ; H01L21/288

Abstract:
A method is provided for forming copper material over a substrate. The method includes forming a barrier layer over a substrate. Then, a depositing-soaking-treatment (DST) process is performed over the barrier layer. A copper layer is formed on the cobalt layer. The DST process includes depositing a cobalt layer on the barrier layer. Then, the cobalt layer is soaked with H2 gas at a first pressure. The cobalt layer is treated with a H2 plasma at a second pressure. The second pressure is lower than the first pressure.
Information query
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