Method of forming inter-metal dielectric layer
    1.
    发明授权
    Method of forming inter-metal dielectric layer 有权
    形成金属间介电层的方法

    公开(公告)号:US06376394B1

    公开(公告)日:2002-04-23

    申请号:US09617458

    申请日:2000-07-17

    Abstract: A fabrication method for an inter-metal dielectric layer is applicable to multi-level interconnects. A substrate is provided with metal lines formed thereon. A first (fluorinated silicon glass) FSG layer with low fluorine content is then formed on the substrate, followed by forming a biased-clamped FSG layer on the first FSG layer. A second FSG layer with low fluorine content is formed on the biased-clamped layer, prior to forming an oxide cap layer on the second FSG layer. The oxide cap layer is planarized until the oxide cap layer is level with the second FSG layer.

    Abstract translation: 金属间介电层的制造方法适用于多层互连。 衬底上形成有金属线。 然后在衬底上形成具有低氟含量的第一(氟化硅玻璃)FSG层,随后在第一FSG层上形成偏置夹持的FSG层。 在第二FSG层上形成氧化物覆盖层之前,在偏压夹层上形成具有低氟含量的第二FSG层。 氧化物盖层被平坦化,直到氧化物覆盖层与第二FSG层平齐。

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