Abstract:
One end of an inductor is connected to a drain of a P-channel type MOS transistor. A source of source of MOS transistor is connected to an electric power source which supplies a voltage Vdd. The other end of inductor is connected via a dummy capacitor to a ground. Furthermore, a dummy resistor is connected between a drain of MOS transistor and the ground. The dummy resistor has the same resistance as that of a parasitic resistor existing between the inductor and the MOS transistor. Another dummy capacitor is connected between the dummy resistor and the ground. A current measuring device is connected between a source of MOS transistor and the ground. A current measuring device is connected between a source of MOS transistor and the ground. A current measuring device is connected between a source of MOS transistor and the ground. A current measuring device is connected between a source of MOS transistor and the ground.
Abstract:
In a device for the monitoring and the prognosis of the failure probability of inductive proximity sensors (1) for the monitoring of the position of movable switch rails or rail components, in which the proximity sensor (1) has at least one coil (5) that is supplied by an oscillator (7), and the sensor current flowing by means of variable attenuation is measured and then fed to an evaluation circuit, characteristic lines (18, 22) of the sensor (1) are stored for the course of the sensor currents in dependency of the distance of the movable switch rails or rail components, i.e. the mechanical attenuation in an electric not additionally attenuated condition, and in an electric additionally attenuated condition. The measurement currents (22) corresponding to a mechanical attenuation condition (18), as well as to respective additionally electric attenuated condition are cyclic scanned. The respective measurement currents, or measurement reading pairs are fed to a comparison or evaluation circuit, in which the differences resulting from the characteristic lines are compared to the measured differences.
Abstract:
An apparatus and method of determining the ratio of an amplification factor before and after changing the amplification factor of a signal normalizer that amplifies the voltage amplitude of signals input from a signal generator so that it stays within a predetermined range, and an alternating-current voltage determination device, including, reversing the phase relationship so that said sine-wave signals are negated, the output voltage amplitude of the signal generator stays within a predetermined range and the step wherein the changing the amplification factor of the signal normalizer and the output voltage amplitude of the signal generator so that they are inversely proportional and a difference is obtained between the output voltage amplitude of the signal normalizer before and after the change.
Abstract:
In a power supply (AC adapter etc.) of an electronic device, a first Y capacitor and a second Y capacitor are connected in series between two AC input lines which are connected to an input AC cable of the power supply so that input AC voltage will be divided, and a third Y capacitor for the prevention of EMI (Electro-Magnetic Interference) is provided between a grounding line on the secondary side of a transformer of the power supply and the connection point between the first Y capacitor and the second Y capacitor. The capacitance of the second Y capacitor is set larger than that of the first Y capacitor and the second Y capacitor having the larger capacitance is connected to a neutral-side AC input line which is connected to the neutral terminal of an AC socket. Due to the capacitance difference between the first Y capacitor and the second Y capacitor, voltage difference between metal part of the electronic device and the ground is reduced, and thereby the electric shock problem of the electronic device is eliminated or reduced considerably. The reduction of the electric shock problem can be attained without deteriorating the portability of the electronic device and the EMI prevention capability.
Abstract:
An apparatus for measuring the inductance of a wire-loop with noise-cancellation, auto-calibration and wireless communication features, or detector circuit. The apparatus measures the effective change in inductance induced in a wire-loop as a vehicle passes over the wire-loop to produce an inductive signature corresponding to a vehicle.
Abstract:
A testing device generates electromagnetic noise such as transients, power interruptions and Radio Frequency Interference (RFI) for application to an electronic device to test the immunity of the electronic device to electromagnetic noise or to test the performance of the electronic device during exposure to electromagnetic noise. The testing device promotes an economical and efficient evaluation of Electromagnetic Compatibility (EMC) of an electronic device during product design or otherwise. The testing device includes a switch having electrical contacts for producing electromagnetic noise during a transition between a closed state and an open state of the electrical contacts and a trigger that is coupled to the switch. The trigger is arranged to change states between the closed state and the open state of the electrical contact. An input terminal is associated with the switch for applying electrical energy to the switch. An output terminal is associated with the switch for connection to the electronic device for testing operation of the electronic device in response to the electromagnetic noise.
Abstract:
A method and an apparatus for measuring insulation resistance capable of removing the influences of piezoelectric noise which is occurring due to mechanical vibrations applied to an electronic component to measure the insulation resistance of the electronic component with high accuracy. In order to do so, a predetermined measured voltage is applied to the electronic component arranged in a position subjected to periodic mechanical vibrations from the outside to measure a current flowing through the electronic component. Then, the value of the measured current flowing through the electronic component is integrated over the period of the mechanical vibrations or over a time which is an integral multiple thereof. With this arrangement, a piezoelectric noise current can be cancelled and only a leakage current to be primarily measured can be extracted. Thus, by calculating the value of the insulation resistance from the value of the current, the insulation resistance can be detected with high accuracy.
Abstract:
A method is provided for quickly determining low threshold voltages and high threshold voltages of a test circuit. Specifically, a transformed voltage transfer curve for the test circuit is generated. The maximum and minimum points of the transfer circuit are determined to calculate transformed voltage threshold values. The transformed voltage threshold are transformed to find the desired threshold voltages.
Abstract:
In a power supply (AC adapter etc.) of an electronic device, a first Y capacitor and a second Y capacitor are connected in series between two AC input lines which are connected to an input AC cable of the power supply so that input AC voltage will be divided, and a third Y capacitor for the prevention of EMI (Electro-Magnetic Interference) is provided between a grounding line on the secondary side of a transformer of the power supply and the connection point between the first Y capacitor and the second Y capacitor. The capacitance of the second Y capacitor is set larger than that of the first Y capacitor and the second Y capacitor having the larger capacitance is connected to a neutral-side AC input line which is connected to the neutral terminal of an AC socket. Due to the capacitance difference between the first Y capacitor and the second Y capacitor, voltage difference between metal part of the electronic device and the ground is reduced, and thereby the electric shock problem of the electronic device is eliminated or reduced considerably. The reduction of the electric shock problem can be attained without deteriorating the portability of the electronic device and the EMI prevention capability.
Abstract:
Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a range of frequencies to the filter inputs, and a voltmeter monitors the voltage across the filter inputs. Different types of filter have different characteristic shapes for the voltage/frequency curve, and processing is applied to the measured results in a compute to determine the location of inflections in the curve and other characteristics of the curve. Methods are disclosed for determining the values of the individual sub-components of the filter. Where the filter is C-section low pass filter, an interactive process is applied to successively improve the accuracy of the component value determinations. Using the techniques described enables the insertion loss of the filter also to be readily calculated by the computer.