TECHNIQUES FOR SEGMENTATION OF DATA PROCESSING WORKFLOWS IN INSTRUMENT SYSTEMS

    公开(公告)号:US20240272956A1

    公开(公告)日:2024-08-15

    申请号:US18166914

    申请日:2023-02-09

    发明人: Trevor Hall

    摘要: Aspects of systems, methods, algorithms, and non-transitory media storing computer-readable instructions for segmenting data processing workflows are provided. In a first aspect, a computer-implemented method for segmenting data processing workflows includes determining a configuration of an instrument system. The instrument system can include an analytical instrument coupled with an instrument PC (IPC). The IPC can be configured to receive raw data from the analytical instrument, to process the raw data, and to communicate with a client computing device coupled with the instrument system. The method can also include segmenting a data process workflow based at least in part on the configuration, attributing at least a subset of constituent operations of the data process workflow to the client computing device or the IPC.

    TRAINED NEURAL NETWORK MODEL TO DETERMINE CARTRIDGE AND SYSTEM HEALTH

    公开(公告)号:US20240264131A1

    公开(公告)日:2024-08-08

    申请号:US18431305

    申请日:2024-02-02

    IPC分类号: G01N30/86 G06V10/82

    CPC分类号: G01N30/8662 G06V10/82

    摘要: Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a chromatography instrument support apparatus may include: first logic to receive, from an imaging device, image data regarding chromatography instrumentation; second logic to determine a state of the chromatography instrumentation by processing the imaging device through a machine-learning computational model; and third logic to display the state of the chromatography instrumentation.

    Systems and methods of operation of linear ion traps in dual balanced AC/unbalanced RF mode for 2D mass spectrometry

    公开(公告)号:US12040174B2

    公开(公告)日:2024-07-16

    申请号:US18308265

    申请日:2023-04-27

    IPC分类号: H01J49/42 H01J49/00 H01J49/02

    摘要: A mass selective ion trapping device includes a linear ion trap and a RF control circuitry. The ion trap includes a plurality of trap electrodes configured for generating a quadrupolar trapping field in a trap interior and for mass selective ejection of ions from the trap interior. The RF control circuitry is configured to apply a balanced AC voltage to the trap electrodes during a first period of time such that an AC voltage applied to a first pair of trap electrodes is of the same magnitude and of opposite sign to an AC voltage applied to a second pair of trap electrodes; apply unbalanced RF voltage to the second pair of trap electrodes during a second period of time; ramp the balanced AC voltage down and the unbalanced RF voltage up during a transition period; and eject ions from the linear ion trap after the second period of time.

    Axial CI source—off-axis electron beam

    公开(公告)号:US12014916B2

    公开(公告)日:2024-06-18

    申请号:US18182176

    申请日:2023-03-10

    IPC分类号: H01J49/14 H01J49/06 H01J49/26

    摘要: An ion source includes an electron generator, an ionization chamber, and a magnetic field. The electron generator is configured to produce electrons. The ionization chamber has an electron entrance aperture through a first wall, an ion exit aperture through a second wall, and an axis. The ionization chamber is configured to produce ions. The magnetic field is arranged to confine electrons in a beam directed through the electron entrance aperture, in a direction within 45 degrees of parallel to the axis, and towards a location displaced from the ion exit aperture.

    Preventing Dry Syringes
    7.
    发明公开

    公开(公告)号:US20240139750A1

    公开(公告)日:2024-05-02

    申请号:US18050583

    申请日:2022-10-28

    IPC分类号: B01L3/02

    CPC分类号: B01L13/02

    摘要: Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a scientific instrument support apparatus, includes timing logic to determine a maximum time without wetting for a syringe; and rinsing logic to control an autosampler to rinse the syringe when the maximum time without wetting is reached.

    ION-TO-ELECTRON CONVERSION DYNODE FOR ION IMAGING APPLICATIONS

    公开(公告)号:US20240087862A1

    公开(公告)日:2024-03-14

    申请号:US18511684

    申请日:2023-11-16

    IPC分类号: H01J43/24 H01J49/02

    CPC分类号: H01J43/246 H01J49/025

    摘要: A metal-channel conversion dynode comprises: a wafer comprising a first face and a second face parallel to the first face and having a thickness less than 1000 μm; and a plurality of channels passing through the wafer from the first face to the second face at an angle to a plane of the first face and a plane of the second face. In some embodiments, each inter-channel distance may be substantially the same as the wafer thickness. In some embodiments, the wafer is fabricated from tungsten. In some other embodiments, the wafer comprises a non-electrically conductive material that is fabricated by three-dimensional (3D) printing or other means and that is coated, on its faces and within its channels, with a metal or suitably conductive coating that produces secondary electrons upon impact by either positive or negative ions.

    MAGNET POSITIONING SYSTEM FOR ION SOURCE
    10.
    发明公开

    公开(公告)号:US20230411135A1

    公开(公告)日:2023-12-21

    申请号:US18251853

    申请日:2021-11-19

    IPC分类号: H01J49/10 H01J49/08

    CPC分类号: H01J49/10 H01J49/08

    摘要: A mass spectrometer includes an ionization assembly including an ionization chamber and at least one ion lens. The removable ionization assembly has a primary axis defined by the direction of an ion beam exiting the ionization assembly, and the ionization chamber and the at least one ion lens arranged along the primary axis. The mass spectrometer further includes an electron source aligned along the primary axis of the ionization assembly and a magnet assembly including a magnet. The electron source configured to provide an electron beam parallel to the primary axis. The magnet assembly movable between a first position in which the magnet is positioned to allow removal of the ion source and a second position in which the magnet is aligned with the electron source.