公开(公告)号：US08694939B1

公开(公告)日：2014-04-08

申请号：US13802181

申请日：2013-03-13

Applicant: Xilinx, Inc.

Inventor： Alan M. Frost ,  Matthew H. Klein ,  Ronald L. Cline

IPC: G06F17/50

CPC classification number: G06F17/5054 ,  G06F2217/84

Abstract: A method for determining a critical junction temperature for a user-design implemented in a field programmable gate array (programmable device), includes: obtaining a static power vs. temperature curve for the user-design implemented in the programmable device; obtaining a system thermal curve for the user-design implemented in the programmable device; and using the static power vs. temperature curve for the user-design implemented in the programmable device and the system thermal curve for the user-design implemented in the programmable device to determine the critical junction temperature.

Abstract translation: 用于确定在现场可编程门阵列（可编程器件）中实现的用户设计的关键结温度的方法包括：获得在可编程器件中实现的用户设计的静态功率对温度曲线; 获得在可编程设备中实现的用户设计的系统热曲线; 并使用在可编程器件中实现的用户设计的静态功率与温度曲线以及在可编程器件中实现的用户设计的系统热曲线来确定临界结温度。