公开(公告)号：US10665515B1

公开(公告)日：2020-05-26

申请号：US16026981

申请日：2018-07-03

Applicant: Xilinx, Inc.

Inventor： Matthew H. Klein ,  Gregory Meredith ,  Joshua Tan

IPC: H01L23/58 ,  H01L21/66 ,  H01L27/118 ,  G01R31/317 ,  G06F30/392

Abstract: Embodiments herein describe binning and placement techniques for assembling a multi-die device to improve yield when a customer requests a high performance feature from the device. For example, the multi-die device may include multiple dies that are interconnected to form a single device or package. In one embodiment, the multiple dies are the same semiconductor die (e.g., have the same circuit layout) which are disposed on a common interposer or stacked on each other. The multi-die device can then be attached to a printed circuit board (PCB). Although the dies in the multi-die device may each include the same feature (e.g., a PCIe interface, SerDes interface, transmitter, memory interface, etc.), the multi-die device is assembled so that not all of the dies have a feature that satisfies the high performance requested by the customer. That is, at least one of the die includes a lower performance feature.