公开(公告)号：US20040227940A1

公开(公告)日：2004-11-18

申请号：US10749363

申请日：2003-12-31

Applicant: Wavefront Research, Inc.

Inventor： Thomas A. Mitchell

IPC: G01J003/28

CPC classification number: G01J3/18

Abstract: A compact spectrometer that is relatively free of spatial and spectral image distortions. The spectrometer includes one or more slit elements located at an object plane, a first optical sub-system having at least one refractive optical element, one or more dispersive elements located substantially at a center plane, a second optical sub-system having at least one refractive optical element, and one or more one detecting elements located at substantially an image plane. The first optical sub-system is capable of substantially collimating, at the center plane, electromagnetic radiation originating from the one or more slit elements. The second optical sub-system is, in one embodiment, substantially symmetric to said first optical sub-system, the center plane being the plane of symmetry. The second optical sub-system is capable of imaging the substantially collimated electromagnetic radiation from the center plane onto the image plane. Another embodiment has a reflective dispersive element, and the first optical sub-system is also the second optical sub-system, acting as a dual optical sub-system.

Abstract translation: 相对没有空间和光谱图像失真的紧凑型光谱仪。 光谱仪包括位于物平面处的一个或多个狭缝元件，具有至少一个折射光学元件的第一光学子系统，基本上位于中心平面处的一个或多个分散元件，具有至少一个的第二光学子系统 折射光学元件，以及位于基本上是图像平面的一个或多个检测元件。 第一光学子系统能够在中心平面上基本上准直来自一个或多个狭缝元件的电磁辐射。 在一个实施例中，第二光学子系统与所述第一光学子系统基本对称，中心平面是对称平面。 第二光学子系统能够将基本上准直的电磁辐射从中心平面成像到图像平面上。 另一个实施例具有反射色散元件，并且第一光学子系统也是第二光学子系统，用作双光学子系统。

公开(公告)号：US20040156048A1

公开(公告)日：2004-08-12

申请号：US10750014

申请日：2003-12-31

Applicant: Wavefront Research, Inc.

Inventor： Thomas A. Mitchell

IPC: G01J003/40 ,  G02B027/10

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0291 ,  G01J3/2823

Abstract: A hyperspectral imager including a first optical sub-system, at least one slit element, a second optical sub-system, at least one reflective dispersive element located at a center plane, and at least one detecting element located at substantially an image surface. During operation, the first optical sub-system images, onto the slit element(s), electromagnetic radiation originating at a source. The second optical sub-system substantially collimates, at a center plane, electromagnetic radiation emanating from the slit element(s). The second optical sub-system also images, onto the image surface, the electromagnetic radiation reflected from the reflective dispersive element(s). The detecting element(s) detect the dispersed electromagnetic radiation reflected from the reflective dispersive element(s).

Abstract translation: 包括第一光学子系统，至少一个狭缝元件，第二光学子系统，位于中心平面的至少一个反射色散元件和位于大致图像表面的至少一个检测元件的高光谱成像器。 在操作期间，第一光学子系统在狭缝元件上成像来自源的电磁辐射。 第二光学子系统在中心平面处基本上准直从狭缝元件发出的电磁辐射。 第二光学子系统还将从反射色散元件反射的电磁辐射图像到图像表面上。 检测元件检测从反射色散元件反射的分散的电磁辐射。